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MicroSystems & MicroFluidics Lab
National Tsing Hua University ESS ESS 5810 Lecture 10 體型微加工製程技術 曾繁根 助理教授 國立清華大學工程與系統科學系 MicroSystems & MicroFluidics Lab Prof. Fan-Gang Tseng
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矽體型微加工技術 Introduction Isotropic Wet Etching
Silicon Crystal Orientation Anisotropic wet etching Etching Stop Possible Shapes
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1. 矽體型微加工技術概論 Pressure sensor
l Definition of Bulk Micromachining:Based on the device shaping by etching a bulk substrate. l Materials used for bulk micromachining: single crystal silicon, gallium arsenide, quartz, etc… Pressure sensor
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1. 矽體型微加工技術概論 Silicon as A Mechanical Material: Major difference:
Silicon yields by fracturing (at room temp) while metals usually yield by deforming inelastically—chipping, cleave along crystallographic planes.
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2. Silicon Isotropic Wet Etching-1
HNA system (HNO3+HF), etching rate can be 50 μm/min: a. Hole injection: b. Oxide formation: c. Oxide etching: Total reaction:
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2. Isotropic Wet Etching-2
Effects: High HF Low HNO3: oxidation limit, rough surface High HNO3 Low HF: etching limit, smooth surface SZE
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2. Isotropic Wet Etching-3
Mask materials
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3. Silicon Crystal Orientation
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Miller index 1. Take the intercepts with three axes, say a, b, c 2. Take the reciprocal of these three integers, multiplied by smallest common denominator, get miller indices (d,e,f)
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Wafer flat <111>
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4-1. Anisotropic wet etching
(on <100> wafer) Concentration ↑: etching rate↓ selectivity ↑ surface roughness↓ Temperature ↑: etching rate ↑ selectivity ↓ surface roughness↑
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4-1. Anisotropic wet etching
(on <100> wafer)
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Comparison (100) wafer <110> direction (110) wafer <110>
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Undercut on convex corner
Concave and convex corner: The surface revealed in concave corner is the slowest one, however, it is the fastest one in convex cases
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Corner compensation-1 KOH B Minimum=1.6 B For EDP For KOH
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Corner compensation-2 EDP KOH (100)>(110)>(111)
(110)>(100)>(111)
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Method to get 90° and 45° wall on (100) silicon wafer by bulk
micromachining EDP (100)>(110)>(111) KOH (110)>(100)>(111)
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Crystal orientation finding on (100) wafer
<110>Wafer flat provide 2-5° accuracy Long slot give around 1 ° accuracy Circular squares along <110> side give 0.1 ° accuracy (80 m pitch) Tan-1(80/45000) =0.1 ° Steckenborn, A et al, Micro System Technologies 91
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Crystal orientation finding on (100) wafer
(<110> direction) F. G. Tseng, unreleased figures <110> direction
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Possible shapes on (100) silicon wafer
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4-2. Anisotropic wet etching
(on <110> wafer) (110) <111>
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4-2. Anisotropic wet etching
(on <110> wafer)
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4-2. Anisotropic wet etching
(on <110> wafer)
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4-2. Anisotropic wet etching
(on <110> wafer)
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Crystal orientation finding on (110) wafer
<111>Wafer flat provide 2-5° accuracy Long slot give around 1 ° accuracy Circular squares along <100> side give 0.06 ° accuracy (35 m pitch) F. G. Tseng, K. C. Chang, ASME IMECE MEMS’01, JMM. <111> <110> <100> R=48.9mm (110) wafer 55 Alignment Circles r R x 109.5°
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Crystal orientation finding on (110) wafer
(<100> direction) -1 1 30 μm 2 4 5 <100> direction Center hexagon 30 μm -1 1 2 3 4 5
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Possible Shape on (110) silicon wafer
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4-3. Anisotropic wet etching
(on <111> wafer)
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5. Etching Stop-1 High Boron Concentration:
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5. Etching Stop-2 Electrochemical etch stop:
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6. Bulk Micromachining by Dry Etching
Deep silicon RIE:
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7. 正八面體晶體輔助工具 Fan-Gang Tseng ESS 5850 <110> <111>
<100> 7. 正八面體晶體輔助工具
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