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Published byCornelius Leonard Stevens Modified over 6 years ago
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News from CMS Process Quality Control
Thomas Bergauer HEPHY Vienna CMS TK Week, , CERN
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Jean-Charles Fontaine
Centers Three Process Qualification Centers: Florence Anna Macchiolo Carlo Civinini Mirko Brianzi Strasbourg Jean-Charles Fontaine Jean-Marie Helleboid Jean-Laurent Agram Vienna Thomas Bergauer Margit Oberegger Characterization by QTC Process stability on test structures with 9 different measurements Thomas Bergauer, HEPHY Vienna
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CVmos at different temperatures
Just a test (Vienna coolingbox was available) CVmos at 5 different temperatures CVmos chosen because it is the simplest measurement No temperature dependence of Vfb Thomas Bergauer, HEPHY Vienna
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Thomas Bergauer, HEPHY Vienna
Thicker Aluminium 39 Teststructures from PQC Florence Perugia 12 (prod.week 34/02) Perugia 13 (03/02) Perugia 14 (06/02 and 23/02) Pisa 59 (08/02) Pisa 60 (24/02) Influence to rho_Alu after Before week 20/02 Average data: before Week 20/02: 26,09mOhms/sq. After week 20/02: 14,34mOhms/sq. Also: slightly lower C_ac value: 17,01pF (before week 20/02) -> 16,65pF (after) Thomas Bergauer, HEPHY Vienna
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Thomas Bergauer, HEPHY Vienna
Mask Problem W7B Misalignment of 3 structures at the standard half moon Not able to contact with probecard in one cycle W7B: 1440 pcs. Cac R (Al, p+, poly) Ivgcd Cint IVbaby Rint CVdiode CVMOS & IV diel Thomas Bergauer, HEPHY Vienna
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Thomas Bergauer, HEPHY Vienna
Mask Problem W7B 3 structures on the standard half moon affected Sensor mask is OK Options: new probecard design OR new wafer mask design GCD C_int Thomas Bergauer, HEPHY Vienna
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Thomas Bergauer, HEPHY Vienna
Inter-calibration Circulation of 5 Teststructures Vienna -> Strasbourg Strasbourg -> Florence Florence -> Vienna -> Florence -> Vienna -> Strasbourg (Exchange of TS during this Tracker Week) Results: (up to now) Good agreement in all measurements Higher Leakage current of Vienna Probecard causes lower R_int and higher IV_dielectric and GCD problems (fit) small differences in capacitances values caused by stray capacitances. (<1pF) Thomas Bergauer, HEPHY Vienna
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Thomas Bergauer, HEPHY Vienna
Software New Software allows re-read of local files Up to now: Stand-alone program Re-analyze Re-write XML file Acquisition Analysis DB Interface Main: Local files Analysis DB Interface new: Future: Fully integrated into acquisition software Acquisition Analysis DB Interface Local files Thomas Bergauer, HEPHY Vienna
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Thomas Bergauer, HEPHY Vienna
Database 322 teststructures successfully loaded into db 61 faulty (status: ) Thomas Bergauer, HEPHY Vienna
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