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Technische Universität München

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Presentation on theme: "Technische Universität München"— Presentation transcript:

1 Technische Universität München
GEM-TPC Meeting Bernhard Ketzer Technische Universität München 03 March 2009 GSI

2 Agenda Communications (B. Ketzer)
Status of TPC FE and readout electronics (I. Konorov) Status of GEM-TPC prototype (B. Voss) Pad plane design (M. Berger) TPC calibration concepts (A. Winnebeck) a.o.b.

3 ELSA Beam Test

4 ELSA Beam Test Achievements:
All detectors installed: trigger scint., 4 Si planes, 4 GEM planes, TPC Slow control for HV and LV Readout electronics and DAQ: FE DB, DATE, S-Link 1 EVB, 1 ROB, 1 HotGeSiCA (Si/GEM), 2 HotGeSiCA (TPC) TCS + trigger module Decoding & online monitoring Commissioning of beam telescope Noise: ~ 700 e- (Si), ~ 1400 e- (GEM) Latencies adjusted fo GEM/Si Efficiency scans for GEM TPC tests Drift field stable up to 400 V/cm, GEM HV up to 106% of nominal 16 T2K chips read out (one by one), noise ~900 e-

5 Noise in the Laboratory

6 Noise at ELSA

7 ELSA Beam Test Problems: Readout FE DB configuration error
Synchronization problem for GEM detectors No remote power cycle for ADCs Only 256 samples could be read for TPC 2nd HotGeSiCA (TPC) did not send data S-Link readout errors when TPC is read together with other equipment Silicon pedestal file not written Slow Control Web interface for HV/LV too slow and not intuitive to use No online gas flow monitoring for GEM/TPC Gas analysis not operational Pressure gauge not available being improved

8 ELSA Beam Test Items to be addressed:
Analysis of beam telescope performance Track reconstruction Alignment Residuals, Efficiencies TPC latch all data understand pulse height spectra correlations with trigger? TPC readout understand problems with latch readout understand timing (inject test pulse) simultaneous latch readout of all chips sparse readout work in progress almost done Goal: Test sparse readout of TPC during present beam time at ELSA! ~ 3 days of beam as main user in March-April

9 T2K Chip Timing Injection of a test pulse synchronized with the trigger Sensitivity: 0.1 fC/ADC ch. Timing: Latency between TCS trigger and pulse measured: 1ms 25 ms time gate (511 samples at 20 MHz)


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