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Characterization of polycrystalline diamond films grown by MWPECVD for UV radiation detection Presenter: M.F. Muscarella Dipartimento Interateneo di.

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Presentation on theme: "Characterization of polycrystalline diamond films grown by MWPECVD for UV radiation detection Presenter: M.F. Muscarella Dipartimento Interateneo di."— Presentation transcript:

1 Characterization of polycrystalline diamond films grown by MWPECVD for UV radiation detection Presenter: M.F. Muscarella Dipartimento Interateneo di Fisica dell'Università e Politecnico di Bari, Via G. Amendola 173, Bari, Italy A full characterization of selected PolyCrystalline Diamond (PCD) films grown by MicroWave Plasma Enhanced Chemical Vapor Deposition (MWPECVD) suitable for UV radiation detectors has been performed. Dark current-voltage and impedance measured on two early grown diamond films have been found to be dependent on the grain size and of the quality of investigated films. A standard charge PA allows to perform sensor optical characterization.

2 Preliminary results Dark currents Impedance measurements
Optical Response

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