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Improving the Electron Microscope
So we can see just a few more nanometers
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Electron Optics Based on the principles of DeBroglie
Electrons and other particles have wave properties Magnetic fields are analogous to optical lenses
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Basics of Electron Microscopy
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Types of Electron Microscopes
Scanning Electron Microscope (SEM) Tunneling Electron Microscope (TEM) Scanning Transmission Electron Microscope (STEM)
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Limitations Target sample must be modified to maintain in a high vacuum Target sample must be conductive. Electron Scattering
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Causes of Poor Resolution
General Electron Diffraction Electro-Optical Aberrations
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Fixing Diffraction Quite simple…
It actually doesn’t need a whole slide to explain.
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Scherzer ‘s Theory Non trivial
Scherzer’s Theory states that aberration will always occur if the following conditions are met: (i) There is a rotationally symmetrical lens present (ii) The beam is acted upon by a static field (iii) The beam does not reverse its velocity
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Correcting Electro-Optical Aberrations
1995 Researchers Have worked on Breaking symmetry on lenses. Resolution improved from 20nm to about 6nm by 1995 Today We can achieve about .075nm resolution
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Correcting Electro-Optical Aberrations
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Correcting Electro-Optical Aberrations
Time varying Fields Very complicated dealing with complex analysis As of now, no one has been able to decrease aberration by implementing a time varying field
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Ende’
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