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Review of Extensible Path Selection Framework

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1 Review of Extensible Path Selection Framework
March 2007 doc.: IEEE /0306r0 March 2007 Review of Extensible Path Selection Framework Date: Authors: Notice: This document has been prepared to assist IEEE It is offered as a basis for discussion and is not binding on the contributing individual(s) or organization(s). The material in this document is subject to change in form and content after further study. The contributor(s) reserve(s) the right to add, amend or withdraw material contained herein. Release: The contributor grants a free, irrevocable license to the IEEE to incorporate material contained in this contribution, and any modifications thereof, in the creation of an IEEE Standards publication; to copyright in the IEEE’s name any IEEE Standards publication even though it may include portions of this contribution; and at the IEEE’s sole discretion to permit others to reproduce in whole or in part the resulting IEEE Standards publication. The contributor also acknowledges and accepts that this contribution may be made public by IEEE Patent Policy and Procedures: The contributor is familiar with the IEEE 802 Patent Policy and Procedures < ieee802.org/guides/bylaws/sb-bylaws.pdf>, including the statement "IEEE standards may include the known use of patent(s), including patent applications, provided the IEEE receives assurance from the patent holder or applicant with respect to patents essential for compliance with both mandatory and optional portions of the standard." Early disclosure to the Working Group of patent information that might be relevant to the standard is essential to reduce the possibility for delays in the development process and increase the likelihood that the draft publication will be approved for publication. Please notify the Chair as early as possible, in written or electronic form, if patented technology (or technology under patent application) might be incorporated into a draft standard being developed within the IEEE Working Group. If you have questions, contact the IEEE Patent Committee Administrator at Michael Bahr, Siemens AG CT Michael Bahr, Siemens AG CT

2 March 2007 doc.: IEEE /0306r0 March 2007 Abstract This presentation gives a motivation for the changes to the text on the extensible path selection framework of TGs. It addresses CID 464 and similar comments. The presentation explaines the more structured approach on the extensible path selection framework. The presentation gives a brief status update on RFI 3 comments of LB 93. Michael Bahr, Siemens AG CT Michael Bahr, Siemens AG CT

3 RFI 3 status clustered RFI 3 comments Status
March 2007 RFI 3 status clustered RFI 3 comments extensible path selection framework (EF) airtime metric (ATM) Link state announcement (LSA) others Status EF: started ATM: going to start (rewrite of clause on airtime metric) LSA: not yet started Michael Bahr, Siemens AG CT

4 Path Selection Protocols and Metrics
March 2007 Path Selection Protocols and Metrics Path Selection Protocol ID defines length of metric field data type of metric field aggregation of metric values (operator) Path Selection Metric ID defines length of metric field data type of metric field operator for aggregation of metric values Path Selection Protocol and Path Selection Metric must be compatible! Realization might be implementation specific Automatic ensurance of compatibility is out of scope, left to configuration Michael Bahr, Siemens AG CT

5 HWMP & Airtime Metric HWMP ID defines length of metric field = 4
March 2007 HWMP & Airtime Metric HWMP ID defines length of metric field = 4 data type of metric field depends on Path Selection Metric ID, default is long aggregation of metric values depends on Path Selection Metric ID, default is addition Airtime Metric ID defines length of metric field = 4 data type of metric field = long operator for aggregation of metric values = addition Compatible! Michael Bahr, Siemens AG CT

6 March 2007 Tasks rewrite and extend section on Extensible Path Selection Framework Extend HWMP / OLSR section with metric characteristics Check all occurences of metric fields in HWMP / RA-OLSR for right terminology (e.g. avoid „addition“ for aggregation of metric values) extend section on Airtime metric with metric characteristics Michael Bahr, Siemens AG CT


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