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Published byDamon Gilmore Modified over 6 years ago
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In the name of God Based on Image Processing for Detecting Tile Defects Adaptive Threshold Heydar Toossian Shandiz Shahrood University of Technology 7Tir Square, P.O.Box Shahrood Iran
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imperfect edges at the tile borders
Defects small spots Three Majors defects thin strips imperfect edges at the tile borders
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Key Information Defects have normally very light or very dark intensity in compare with normal texture on tile surface
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Binary Image cracks, scratches, pin-holes, spots and chips dark nature
Gray level defects such as water drops, color grade and blobs Light nature
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Putting M by N image pixels of tilt to array Y
First Step of 5 Putting M by N image pixels of tilt to array Y Data set = {X , Y} X is index of vector Y
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Second step of 5 Changing Y image to binary image by Thershold T, Which is initially set to zerro
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Regression line is calculated
Third step of 5 Regression line is calculated
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Fourth step of 5 E=Abs ( Y-f )
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Last step of 5 eMax( T ) = Max { E }
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eMax Versus T
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∆T > Γ Then The tile is defected
Clasifier ∆T=T1 – T0 ∆T > Γ Then The tile is defected
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Calculating the Γ Γ= μ p + α σ p
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Sample Tiles
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Key parameters for samples
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Thanks all
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