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SEM monitors tests PSI 17..19 February 2006 62 MeV protons
Previously irradiated standard SEM PSI New SEM with grounded plates around ceramics C II F type SEM with no ceramics between HV and SIGNAL F type
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F type BLM_S
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F type BLM_S
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Ceram II (CII)
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BLM_S Geant4 Simulation Secondary Emission Yield 0. 057 e-/primary @ 1
BLM_S Geant4 Simulation Secondary Emission Yield GeV
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SEM Foil Geant4 Simulation Secondary Emission Yield 0
SEM Foil Geant4 Simulation Secondary Emission Yield GeV From Calibration: 0.036! 450 GeV
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HV scan F Type Transverse with 1cm collimator 7e8p+/s/cm2
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BLM_S Linearity from May 06 in PSB (1 point per bunch)
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Simultaneous measurement with SEM and ACEM (SEM directly in the beam)
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Transient effect when changing HV in transverse position – effect on the CERAMICS?
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19 FEB 2006 F SEM COLLIMATOR position scan
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19 FEB 2006 F SEM HV scan with Cu collimator
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Ceram II Beam on Connectors shielding removed
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F Type Beam on connectors
HV Beam I Beam II F Type Beam on connectors 80pA/cm2 16pA/cm2
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Attempt to calculate SEY from Bethe Bloch
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