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Visual Field Digest Teaching Kit Chapter 7

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1 Visual Field Digest Teaching Kit Chapter 7
HAAG-STREIT AG

2 Teaching Kit Copyright
The Visual Field Digest Teaching Kit includes all figures and illustrations from the Visual Field Digest. They can be used for non-commercial presentations free of charge. Haag-Streit AG allows the use of this figures for personal or academic use under the conditions that (i) it is used without commercial purpose and (ii) the content is reproduced exactly as the original by mentioning Haag-Streit AG, Switzerland as the owner of the copyright. Non-academic, non-personal or commercial users might only use this figures in whole or in part after a written authorization by the copyright holder. “Haag-Streit”, “900” and “Octopus” are either registered trademarks or trademarks of Haag-Streit Holding AG. The following are either registered trademarks or trademarks of Carl Zeiss Meditec: “Guided Progression Analysis”, “GPA”, “Humphrey”, “HFA”, “SITA”, “SITA Fast”, “SITA Standard”, “Visual Field Index”, and “VFI”. Copyright © 2018 HAAG-STREIT AG

3 Fig. 7-1: Relationship among different visual field representations

4 Fig. 7-2: Values representations display sensitivity thresholds

5 Fig. 7-3: Values

6 Fig. 7-4: Grayscale (Values)

7 Fig. 7-5: Comparisons representation displays deviations from the normal visual field

8 Fig. 7-6: Comparisons

9 Fig. 7-7: Grayscale (Comparisons)

10 Fig. 7-8: Inverse relationship between Values and Comparisons representations

11 Fig. 7-9: Distribution of sensitivity thresholds of the normal population

12 Fig. 7-10: Probabilities

13 Fig. 7-11: Defect Curve

14 Fig. 7-12: Cluster Analysis displays ten cluster mean defects

15 Fig. 7-13: Cluster Analysis

16 Fig. 7-14: Design of the Polar Analysis

17 Fig. 7-15: Polar Analysis

18 Fig. 7-16: Corrected Comparisons and its relationship with other corrected representations

19 Fig. 7-17: Corrected Comparisons

20 Fig. 7-18: Grayscale of Corrected Comparisons

21 Fig. 7-19: Corrected Probabilities

22 Fig. 7-20: Corrected Cluster Analysis

23 Fig. 7-21: Square root of Loss Variance (sLV)

24 Fig. 7-22: False positive (FP) answers

25 Fig. 7-23: False negative (FN) answers

26 Table 7-1: Global indices available for Octopus perimeters

27 Table 7-2: Reliability indices available on Octopus perimeters

28 Box 7A: Defect Curve

29 Box 7B-1: Design of Cluster Aanalysis

30 Box 7B-2: Cluster Analysis for different test patterns

31 Box 7C: Diffuse Defect (DD)

32 Box 7D: Local Defect (LD)


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