1. UCSB Qualification Module Grading
24 TOB 6 chip (L56p) modules tested using ST qualification batch sensors
Failure rates/sources (excluding CMN modules)
0.34% bad channels on average
0.27% Known bad sensor channels
0.033% Unmarked bad sensor channels (All Noisy)
A factor 5 lower rate than previously
Istrip data missing from at least one sensor in each of the effected channels
0.011% open hybrid-APV bonds
0.016% module bonding
0.005% saturated FE
1 channel with low noise & no cal. injection response with no sensors connected
Module Grades
22 Grade A
1 Grade B
1 Grade A/F
1 CMN module

2. Comparison of 4 Chip and 6 Chip Modules
In previous talk, decrease in gain shown in 4 chip modules with the final 50 W inverter resistor
Required re-tuning of cuts
Now it appears that load capacitance of 6 chip TOB module different enough to require different set of cuts
Noise 10% lower
Faster peaking time, etc
Currently finalizing cuts and checking false flagging rates and bad channel finding efficiency
Once that is finished, we will begin to insert info into database
6 chip TOB modules are only modules built so far at UCSB with qualification sensors and good, final hybrids
Final Hybrids
6 chip TOB
Final Hybrids
4 chip TOB