1. Professor Ronald L. Carter ronc@uta.edu http://www.uta.edu/ronc/
Semiconductor Device Modeling and Characterization – EE5342 Lecture 27 – Spring 2011
Professor Ronald L. Carter

2. The npn Gummel-Poon Static ModelRC
ICC - IEC =
IS(exp(vBE/NFVt
- exp(vBC/NRVt)/QB B
RBB
ILC
IBR B’
ILE
IBF RE E
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3. Gummel Poon npn Model Equations
IBF = ISexpf(vBE/NFVt)/BF
ILE = ISEexpf(vBE/NEVt)
IBR = ISexpf(vBC/NRVt)/BR
ILC = ISCexpf(vBC/NCVt)
QB = (1 + vBC/VAF + vBE/VAR ) 
{½ + [¼ + (BFIBF/IKF + BRIBR/IKR)]1/2 }
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4. Static Model Eqns. Parameter Extraction
In the region where Irec < Inrm < IKF, and iD*RS << Vd.
iD ~ Inrm = IS(exp (Vd/(NVt)) - 1)
{diD/dVd}/iD = d[ln(iD)]/dVd = 1/(NVt)
so N ~ {dVd/d[ln(iD)]}/Vt  Neff,
and ln(IS) ~ ln(iD) - Vd/(NVt)  ln(ISeff).
Note: iD, Vt, etc., are normalized to 1A, 1V, resp.
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5. BJT Characterization Reverse Gummel
vBEx= 0 = vBE + iBRB - iERE
vBCx = vBC +iBRB +(iB+iE)RC
iB = IBR + ILC =
(IS/BR)expf(vBC/NRVt)
+ ISCexpf(vBC/NCVt)
iE = bRIBR/QB =
ISexpf(vBC/NRVt)
(1-vBC/VAF-vBE/VAR )
{IKR terms }-1 iE RC iB RE RB
vBCx
vBC
vBE + -
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6. Sample rg data for parameter extraction
IS=10f
Nr=1
Br=2
Isc=10p
Nc=2
Ikr=.1m
Vaf=100
Rc=5
Rb=100
iB data
iE data
iE, iB vs. vBCext
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7. Reverse Gummel Data Sensitivitiesc
Region a - IKRIS, RB, RC, NR, VAF
Region b - IS, NR, VAF, RB, RC
Region c - IS/BR, NR, RB, RC
Region d - IS/BR, NR
Region e - ISC, NC
vBCx = 0 a d e iB b iE
iE(A),iB(A) vs. vBC(V)
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8. References
* Semiconductor Physics & Devices, by Donald A. Neamen, Irwin, Chicago, 1997.
**Device Electronics for Integrated Circuits, 2nd ed., by Richard S. Muller and Theodore I. Kamins, John Wiley and Sons, New York, 1986
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