1. Instrumentation and Metrology for Nanomanufacturing --
Industrial Application Focus Areas
Thank you, Dave. Before I get started I want to thank the organizing committee for inviting me to speak at this conference. The whole area of nanotechnology is very exciting but what I want to discuss today is how nanotechnology may impact the aviation industry.
_________________________
-- F-117.
Dr. Sharon Smith
Director of Technology
Lockheed Martin Corporation
January 27-29, 2004

2. Nanometrology: Focus Areas
In Addition to Advances Addressed in the Other Workshop Sessions,
i.e., Nanocharacterization, Namomechanics, and Nanofabrication,
Nanomanufacturing Will Require Special Emphasis in the Following
Areas During The Next 10 Years, Details to Be Discussed at
Workshop:
  Development of International Standards, Calibration Tools
and Processes
The Ability to Support Manufacturing Under Processing
Conditions Such As Variable Temperatures, Pressures
Automation of the Entire Manufacturing Process, With
Self-calibration and Adjustment
Need to Identify New Measurement Parameters, TBD, Resulting
From nm Size Manufacturing and Tools to Measure Them
Development of Modeling and Simulation (M&S) Tools and
Analysis Software, With Accuracies at the nm and Smaller Level
Higher Throughput Requiring, e.g., Higher Speed of Analysis
Such As From AFMs

3. Industry Focus Areas (cont.)
  Integrated Systems, e.g., Automatic Comparison to M&S Data, and
Automatic Feed Back Loops, All Needed to Support End Product
Quality, e.g., For the Identification of Failure Modes Early in the
Process
Low Cost for Instrumentation but Also for Measurements and
Analyses
 Precision and Accuracy, Both of Which Take on a New
Importance, When Some Measurands May Be at the Atomic Level
Ability to Support Whole System Scale-up, i.e., From Individual
Nanocomponents Such As Wires and Quantum Dots to Devices and
Meso/macro Components to Systems to Ensure, for Example, That
the Nanoproperties Are in Tact As Expected 
 Ability to Measure Key Parameters Under Stressed Conditions
Embedded Sensors
Ability to Measure Subsurface Defects
The Ability to Support Remote Manufacturing, Including the
Metrology Processes During Manufacturing and on Final Products