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MOSFETs - An Introduction
Chapter 17. MOSFETs - An Introduction Sung June Kim
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CONTENTS Qualitative Theory of Operation
Quantitative ID - VD Relationships Subthreshold Swing ac Response
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Qualitative Theory of Operation
Assumption Ideal Structure Long Channel Enhancement-Mode MOSFET=MOS-Capacitor + 2 pn junctions n - channel (p-type substrate)
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Visualization of various phases of VG > VT MOSFET operation
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VD = 0 Case When VG VT, very few electrons in the channel, an open circuit between the n+ region When VG > VT, Inversion layer is formed The conducting channel (induced “n-type” region, inversion layer) connects the D & S VG → the pile up of electrons & conductance VG determines the maximum conductance Thermal equilibrium prevails, and ID=0
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The VD is increased in small steps starting from VD = 0
The channel acts like a simple resistor ID VD The reverse bias junction current is negligible voltage drop from the drain to the source starts to negate the inverting effect of the gate VD → Depletion of the channel & # of carriers & conductance & slope-over in the IV
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Pinch - off (VD = VDsat) Disappearance of the channel adjacent to the drain The slope of the ID-VD becomes approximately zero(Point B)
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Post-pinch-off (VD > VDsat)
The pinched-off portion widens from just a point into a depleted channel section L The pinched-off section absorbs most of the voltage drop in excess of VDsat For L << L, the shape of the conducting region and the potential across the region do not change & Constant ID For L ~ L, ID will increase with VD > VDsat
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ID - VD Characteristics
General form of the ID - VD (L << L ) For VG VT , ID 0 For VG >VT , transistor action: ID is modulated by VG VD > VDsat : saturation region VD < VDsat : linear(triode) region The slope increases with VG VDsat increases with VG
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Quantitative ID - VD Relationships
Effective Mobility : Impurity Scattering + Lattice Scattering + Surface Scattering
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Effective Mobility
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Square - Law Theory VD < VDsat Drift current is dominant
At an arbitrary point y Inversion layer charge density(q/cm^2)
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Integrating
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VD VDsat ID is approximately constant
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Bulk-Charge Theory As VD increases, the depletion width widens from S to D. With changes in the depletion width, W(y), taken into account, where, making use of the delta-depletion results, Combinig (1) to (2), and introducing One obtains the bulk-charge theory analogue of QN(y) …(1) …(2)
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Bulk-Charge Theory ID -VD relationship
An expression for VDsat can be obtained by noting when , Inversion layer charge density(q/cm^2)
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Inversion layer charge density(q/cm^2)
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Subthreshold transfer characteristics
At weak inversion, diffusion current dominates In long channel MOSFETS the subthreshold current varies exponentially with VG and is independent of VD provided VD > a few kT/q
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Subthreshold swing
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17.3 a.c. Response Cgs(Cgd): The interaction between G and the channel charge near S(D) Cgsp,Cgdp: parasitic or overlap capacitances
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Small-signal equivalent circuit
D in MOSFET out S S G S D vd + - vg gmvgs gd
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A capacitor behaves like an open circuit at low frequencies.
G S D vd + - vg gmvgs gd Cgd Cgs A capacitor behaves like an open circuit at low frequencies.
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ID(VD,VG) + id = ID(VD + vd , VG +vg)
id = ID(VD + vd , VG +vg) - ID(VD,VG)
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id G S D vd + - vg gmvgs gd
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Table 17.1 Below pinch-off (VD≤VDsat) Above pinch-off (VD>VDsat)
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At the higher operational frequencies encountered in practical applications, the circuit must be modified to take into account capacitive coupling between the device terminals. The overlap capacitance is minimized by forming a thicker oxide in the overlap region or preferably through the use of self aligned gate procedures. Cgd is typically negligible. G S D vd + - vg gmvgs gd Cgd Cgs
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Cutoff Frequency The fT be defined as the frequency where the MOSFET is no longer amplifying the input signal under optimum conditions. Value of the output current to input current ratio is unity
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Small Signal Characteristics
gd vs. VG(VD=0) Extrapolating the linear portion of the gd-VG characteristics into the VG axis and equating the voltage intercept to VT Deduce the effective mobility from the slope
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Gate Capacitance vs. VG (VD=0)
Diagnostic purposes in much the same manner as the MOS-C C-VG characteristics Unlike the MOS-C , a low-frequency characteristics is observed even for frequencies exceeding 1MHz Because the source and drain islands supply the minority carries
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