1. NA Photovoltaic Materials Committee Liaison Report
NA PV Liaison Report - Baylies/BayTech
NA Photovoltaic Materials Committee Liaison Report
Updated Feb 25, 2013
Berlin, March 9, 2010

2. Lori Nye (Brewer Science)
Co-chairs
Lori Nye (Brewer Science)
John Valley (MEMC)
NA PV Materials Committee Liaison

3. NA Photovoltaic Materials Committee
C: Lori Nye – Brewer Science
C: John Valley – MEMC
PV Electrical and Optical
Properties Measurement TF
Austin Blew – Lehighton Electronics
Chris Moore – Semilab
Int’l PV Analytical Test Methods TF
Hugh Gotts – Balazs Analytical
Services
NA PV Committee Liaison

4. NA PV Materials Committee Liaison
Meeting Information
Last meeting
NA Fall Standards Meetings
SEMI HQ, San Jose, CA
Oct 30-31, 2012
Next meeting
NA Spring Standards Meetings
April 2-3, 2013
Check for the latest update
NA PV Materials Committee Liaison

5. Ballot Results Summary [1]
Document 4675B, New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry
Failed and reballoted in cycle
Document 5438, Test Method for the Measurement of Oxygen Concentration in PV Silicon Materials for Silicon Solar Cells by Inert Gas Fusion Infrared Detection Method
Passed and published as PV
NA PV Materials Committee Liaison

6. Ballot Results Summary [2]
Doc. 5436, Auxiliary Information on Round Robin Report for SEMI PV10 Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon
Approved and published as AUX
NA PV Materials Committee Liaison

7. NA PV Materials Committee Liaison
New SNARFs [1]
PV Analytical Test Methods TF
Doc. 5501: Auxiliary document to include interlaboratory study for PV43 - Test Method For The Measurement Of Oxygen Concentration In PV Silicon Materials For Silicon Solar Cells By Inert Gas Fusion Infrared Detection Method
Interested lab participants, contact Patrick Schnabel at Evans Analytical
PV Silicon Materials TF
Doc. 5502: Line item Revision to SEMI PV39: Test Method For In-line Measurement Of Cracks In PV Silicon Wafers By Dark Field Infrared Imaging
NA PV Materials Committee Liaison

8. NA PV Materials Committee Liaison
Ballot for cycle 1 & 2, 2013
Doc. 4675C, New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock by Bulk Digestion, Inductively-Coupled-Plasma Mass Spectrometry
To be reviewed at NA Spring 2013 meeting
Doc. 5439, Revision to SEMI PV , Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor
NA PV Materials Committee Liaison

9. Int’l PV Analytical Test Methods TF [1]
Leader: Hugh Gotts (Balazs Analytical Services)
Charter: Develop standards for analytical test methods for PV industry.
Published 6 Standards, 5 Auxiliary Information
PV Test Method for Measuring Trace Elements in Si. Feedstock for Si. Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry
PV Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse
PV Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon
NA PV Materials Committee Liaison

10. Int’l PV Analytical Test Methods TF [2]
PV Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor
PV Test Method for Simultaneously Measuring Oxygen, Carbon, Boron And Phosphorus in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry
PV Test Method for the Measurement of Oxygen Concentration in PV Silicon Materials for Silicon Solar Cells by Inert Gas Fusion Infrared Detection Method
NA PV Materials Committee Liaison

11. Int’l PV Analytical Test Methods TF [3]
Auxiliary Information — A Type of Document that is independently published, not a part of a Standard or Safety Guideline, containing illustrative, explanatory, or supporting material (e.g., application information, examples)
AUX , Auxiliary Information for Contactless Measurement of Carrier Recombination Lifetime in Silicon Wafers and Ingots
AUX , Auxiliary Information for Interlaboratory Study Results For Determining the Precision of SEMI PV1
AUX , Auxiliary Information Conversion of units for impurity concentrations in Silicon
AUX , Research Report On Interlaboratory Study To Establish Precision Statements For SEMI PV13, Test Method For Contactless Excess-charge-carrier Recombination Lifetime Measurement In Silicon Wafers, Ingots, And Bricks Using An Eddy-current Sensor
AUX , Results of Round Robin for SEMI PV10, Test Method for Instrumental Neutron Activation Analysis (INNA) of Silicon
NA PV Materials Committee Liaison

12. Int’l PV Analytical Test Methods TF [4]
Drafting
Doc. 5435: Auxiliary Information interlaboratory study for PV25 - Test Method for Simultaneously Measuring Oxygen, Carbon, Boron and Phosphorus in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry
Doc. 5501: Auxiliary Information interlaboratory study for PV43 - Test Method for Measurement Of Oxygen Concentration In PV Silicon Materials For Silicon Solar Cells By Inert Gas Fusion Infrared Detection Method
NA PV Materials Committee Liaison

13. PV Electrical and Optical Properties Measurements TF [1]
Austin Blew/Lehighton Electronics
Chris Moore/Semilab
Charter : Develop standards for measuring electrical and optical properties of PV materials that become an integral part of a PV “device” e.g. cells, modules, etc.
NA PV Materials Committee Liaison

14. PV Electrical and Optical Properties Measurements TF[2]
Published Standards
PV Guide for Defining Conditions for Angle Resolved Light Scatter Measurements to Monitor The Surface Roughness and Texture of PV Materials
PV Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge
PV Test Method for Spectrally Resolved Reflective and Transmissive Haze of Transparent Conducting Oxide (TCO) Films for PV Application
NA PV Materials Committee Liaison

15. PV Electrical and Optical Properties Measurements TF[3]
Drafting
Doc. 4825, New standard: Test Methods for Hg Probe Measurements of Crystalline Silicon PV Materials and Devices
Doc. 5394, New Standard: Test Method for QSS Microwave PCD Measurements of Carrier Decay and Lifetime
Doc. 5093, Auxiliary Information, Round Robin (Multi-Laboratory Test) for PV9-1110
NA PV Materials Committee Liaison

16. NA PV Materials Committee Liaison
Questions?
Contact Kevin Nguyen at
NA PV Materials Committee Liaison