1. The learning goal of this course is the basic operation of atomic force microscope, and operation principle of several basic imaging modes in the family of scanning probe microscopy and their advanced applications.

2. Tentative Syllabus and Topics
( may change slightly as we proceed through the semester)
Overview of scanning probe microscopy, working principles of STM and AFM and some important parts in the instruments.
Hands on experience of atomic force microscope
Toward imaging with the theoretical resolutions.
More working principles for new imaging mode and their applications
In-situ electrochemistry of AFM and STM
Application beyond imaging (1)  Nanoelectronics and molecular electronics
Application beyond imaging (2)  Nanofabrication
Application beyond imaging (3)  Single molecular force spectroscopy
Application beyond imaging (4)  Nanomechanics/chemical and biochemical detection.