1. Hot/dead map Compared run by run difference Basic features Strategy
First with 200 GeV Au+Au data
Selected up 10 runs including before and after the 4 repairs
Basic features
Run by run change is mostly on chip by chip basis
At least 143/480 chips varies
25/480 dead/hot pattern-varying chips (5% of total)
Better to mask forever?
Strategy
Make a reference hit/dead map for each chip common all runs
Make run by run map of chips with good or bad flag
Mask pattern-changing chips
(or prepare run-by-run pixel maps for those chips?)
How to identify run by run chip dead/alive? (Most important)
By sampling and checking runs by eyes?
Could still miss dead/alive chip information in some runs
(Better) Some automatic distinction possible?
Variance of rate per chip in runs to be checked

2. Run-by-run dead or alive
Pixel pattern variations

3. Beginning of 200 GeV Au Run

4. Before 1st Repair(May 11)

5. After 1st Repair(May 11)

6. Before 2nd Repair(May 18)

7. After 2nd Repair(May 18)

8. Before 3rd Repair(May 23)

9. After 3rd Repair(May 23)

10. Before 4th Repair(Jun 1)

11. After 4th Repair(Jun 1)