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ECE 875: Electronic Devices

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Presentation on theme: "ECE 875: Electronic Devices"— Presentation transcript:

1 ECE 875: Electronic Devices
Prof. Virginia Ayres Electrical & Computer Engineering Michigan State University

2 Lecture 24, 12 Mar 14 Chp 03: metal-semiconductor junction Currents:
Thermionic emission model Examples Richardson constant(s) Additional models VM Ayres, ECE875, S14

3 Start: EC VM Ayres, ECE875, S14

4 JTE = J s->m + J m->s
Total Thermionic Current density: JTE = J s->m + J m->s JTE = = {JTE-sat} JTE-sat = VM Ayres, ECE875, S14

5 JTE = {JTE-sat} {JTE-sat} = Jdiode = {Jdiode-sat}
Metal-semiconductor thermionic current density: JTE = {JTE-sat} {JTE-sat} = Similar in form to pn junction current density: Jdiode = {Jdiode-sat} VM Ayres, ECE875, S14

6 Example: VM Ayres, ECE875, S14

7 Answer: VM Ayres, ECE875, S14

8 VM Ayres, ECE875, S14

9 VM Ayres, ECE875, S14

10 VM Ayres, ECE875, S14

11 VM Ayres, ECE875, S14

12 Metal-semiconductor junction with Schottky barrier  WD:
-- ND+ ND+ WD p+n junction  WD: p+ semiconductor -- NA ND+ ND+ NA VM Ayres, ECE875, S14 WD

13 Metal-semiconductor junction with Schottky barrier  WD  CD
C-V measurement good C-V: ybi => ideal qfBn0 I-V: TE: real qfBn (also photoelectric measurement) qfBn = qfBn0 -Df -- ND+ ND+ WD p+n junction  WD  CD: p+ semiconductor -- NA ND+ ND+ NA VM Ayres, ECE875, S14 WD

14 Metal-semiconductor junction with Schottky barrier  WD  CD
C-V measurement good -- ND+ ND+ WD Intercept: ybi Slope: ND VM Ayres, ECE875, S14

15 Metal-semiconductor junction with Schottky barrier  WD  CD
C-V measurement good C-V: ybi => ideal qfBn0 I-V: TE: real qfBn (also photoelectric measurement) qfBn = qfBn0 -Df -- ND+ ND+ WD Intercept: ybi Slope: ND VM Ayres, ECE875, S14

16 Example: real ^ VM Ayres, ECE875, S14

17 VM Ayres, ECE875, S14

18 VM Ayres, ECE875, S14

19 intercept VM Ayres, ECE875, S14

20 VM Ayres, ECE875, S14

21 Now use this 2nd Df to make a 2nd estimate for ND
Try it: Now use this 2nd Df to make a 2nd estimate for ND VM Ayres, ECE875, S14

22 VM Ayres, ECE875, S14

23 Lecture 24, 12 Mar 14 Chp 03: metal-semiconductor junction Currents:
Thermionic emission model Examples Richardson constant(s) Additional models VM Ayres, ECE875, S14

24 A = Richardson constant = 120 A/cm2 K2
m* = # m0 With m* = m0 = 9.1 x kg, A* = A A = Richardson constant = 120 A/cm2 K2 VM Ayres, ECE875, S14

25 Conductivity effective masses m*/m0 result in:
“Ge-like” surface: 8 equivalent directions VM Ayres, ECE875, S14

26 In your HW Pr. 08 (b): A* -> A**
If tunnelling is present, it will significantly impact A*: p. 162 fP is probability of thermionic emission over barrier assuming the electrons have a Maxwellian distribution of energies fp is distorted from a straight percent by amount fQ, which is related to additional quantum mechanical tunneling and reflection VM Ayres, ECE875, S14


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