Presentation is loading. Please wait.

Presentation is loading. Please wait.

SEM Analysis of Wire from Aging Test #7 at Duke University

Published byVictor Horton Modified over 5 years ago

Similar presentations

Presentation on theme: "SEM Analysis of Wire from Aging Test #7 at Duke University"— Presentation transcript:

1 SEM Analysis of Wire from Aging Test #7 at Duke University
Jack Fowler

2 Module Test Layout Jack Fowler, Duke HEP

3 Duke Wire Samples Analyzed
Xe-CO2 gas volume Wire 14 – Production wire with glass joint Xe-CF4-CO2 gas volume Wire 19 - Production wire with glass encapsulated joint Wire 20 - Production wire with polyimide joint Wire 22 - Production wire with no joint Wire 23 - Production wire with PEEK joint Wire 31 – Pre-series wire with no wire joint None of the wires shown were cleaned prior to installation into chamber Wire analysis Performed at Analytical Instrumentation Facility at North Carolina State University Jack Fowler, Duke HEP

4 Wire 14 Glass Wire Joint Gas Volume - Xe-CO2 Current - 14.8 A
Charge ~ 2.5 to 3.0 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Light deposits of Na and Cl Jack Fowler, Duke HEP

5 Wire 19 Glass Encapsulated Wire joint
Gas Volume - Xe-CO2 -CF4 Current A Charge ~ 2.4 to 2.9 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Few deposits Jack Fowler, Duke HEP

6 Wire 20 Polyimide Wire Joint
Gas Volume - Xe-CO2 -CF4 Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr No visible change Jack Fowler, Duke HEP

7 Wire 14 Segment 4 Gas Volume - Xe-CO2 Glass Wire Joint
Current A Charge ~ 2.5 to 3.0 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr No deposits Jack Fowler, Duke HEP

8 Wire 14 Segment 5 Gas Volume - Xe-CO2 Glass Wire Joint
Current A Charge ~ 2.5 to 3.0 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Jack Fowler, Duke HEP

9 Wire 14 Segment 5 Gas Volume - Xe-CO2 Glass Wire Joint
Current A Charge ~ 2.5 to 3.0 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Fine Deposits are Na and Cl Jack Fowler, Duke HEP

10 Wire 19 Segment 4 Gas Volume - Xe-CO2 -CF4 Glass Encap Wire Joint
Current A Charge ~ 2.4 to 2.9 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores Gold etching and removal Jack Fowler, Duke HEP

11 Wire 19 Segment 4 Gas Volume - Xe-CO2 -CF4 Glass Encap Wire Joint
Current A Charge ~ 2.4 to 2.9 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores Gold etching and removal Notice the loss of surface definition and grain boundaries Jack Fowler, Duke HEP

12 Wire 19 Segment 5 Gas Volume - Xe-CO2 -CF4 Glass Encap Wire Joint
Current A Charge ~ 2.4 to 2.9 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores Gold etching and removal Jack Fowler, Duke HEP

13 Wire 19 Segment 5 Gas Volume - Xe-CO2 -CF4 Glass Encap Wire Joint
Current A Charge ~ 2.4 to 2.9 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores Gold etching and removal Jack Fowler, Duke HEP

14 Wire 20 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores Gold etching and removal Jack Fowler, Duke HEP

15 Wire 20 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores Gold etching and removal Again loss of surface definition Jack Fowler, Duke HEP

16 Wire 20 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Area show at 2 kV beam energy Jack Fowler, Duke HEP

17 Wire 20 Segment 5 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Surface is covered with deposits Jack Fowler, Duke HEP

18 Wire 20 Segment 5 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Pores in surface Faint grain boundaries still present Deposits are mainly Au Jack Fowler, Duke HEP

19 Wire 20 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Discolored region near wire joint ~700 m Jack Fowler, Duke HEP

20 Wire 20 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Here is the section where the transition occurs Jack Fowler, Duke HEP

21 Wire 20 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Very heavy gold damage This affect was seen on both sides of the wire joint. Jack Fowler, Duke HEP

22 Wire 22 Segment 4 Gas Volume - Xe-CO2 -CF4 No Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores Notice large regions where it appears that gold surface is uneven, possibly islands removed Jack Fowler, Duke HEP

23 Wire 22 Segment 4 Gas Volume - Xe-CO2 -CF4 No Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores All surfaces appear in the same condition Jack Fowler, Duke HEP

24 Wire 22 Segment 5 Gas Volume - Xe-CO2 -CF4 No Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores and islands Jack Fowler, Duke HEP

25 Wire 22 Segment 5 Gas Volume - Xe-CO2 -CF4 No Wire Joint
Current A Charge ~ 2.3 to 2.7 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores Jack Fowler, Duke HEP

26 Wire 23 Segment 3 Gas Volume - Xe-CO2 -CF4 PEEK Wire Joint
Current A Charge ~ 0.8 to 1.0C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Fine deposits Grain definition is reduced Jack Fowler, Duke HEP

27 Wire 23 Segment 3 Gas Volume - Xe-CO2 -CF4 PEEK Wire Joint
Current A Charge ~ 0.8 to 1.0C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Fine deposits Grain definition is reduced Jack Fowler, Duke HEP

28 Wire 23 Segment 4 Gas Volume - Xe-CO2 -CF4 PEEK Wire Joint
Current A Charge ~ 0.8 to 1.0C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Fine deposits Grain definition is reduced Jack Fowler, Duke HEP

29 Wire 23 Segment 5 Gas Volume - Xe-CO2 -CF4 PEEK Wire Joint
Current A Charge ~ 0.8 to 1.0C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Fine deposits Grain definition is reduced Jack Fowler, Duke HEP

30 Wire 31 Segment 4 Wire - thin plated preseries
Gas Volume - Xe-CO2 -CF4 Current A Charge ~ 1.2 to 1.5 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Large pores Heavy gold damage Jack Fowler, Duke HEP

31 Wire 31 Segment 7 Wire - thin plated preseries
This region was visibly darkened during removal Gas Volume - Xe-CO2 -CF4 Current A Charge ~ 1.2 to 1.5 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Small deposits Jack Fowler, Duke HEP

32 Wire 31 Segment 7 Wire - thin plated preseries
This region was visibly darkened during removal Gas Volume - Xe-CO2 -CF4 Current A Charge ~ 1.2 to 1.5 C/cm Exposed Time ~ 1680 hrs Target Flow Rate ~ 15cc/hr Small deposits of F Jack Fowler, Duke HEP

33 IU Wire Samples Analyzed
Xe-CO2 gas volume Wire 2 – Production wire with polyimide joint Xe-CF4-CO2 gas volume Wire 18 - Production wire with no joint Wire 19 - Production wire with polyimide joint Wire 39 - Production wire with polyimide joint None of the wires shown were cleaned prior to installation into chamber Wire analysis Performed at Analytical Instrumentation Facility at North Carolina State University Jack Fowler, Duke HEP

34 IU Wire 2 Segment 1 Gas Volume - Xe-CO2 Polyimide Wire Joint
Current – 1.4 A Charge ~ 3.3 C/cm Exposed Time – 672 hrs Target Flow Rate ~15 cc/hr C deposits Jack Fowler, Duke HEP

35 IU Wire 2 Segment 1 Gas Volume - Xe-CO2 Polyimide Wire Joint
Current – 1.4 A Charge ~ 3.3 C/cm Exposed Time – 672 hrs Target Flow Rate ~15 cc/hr C deposits and Pores Fine white deposits Jack Fowler, Duke HEP

36 IU Wire 2 Segment 4 Gas Volume – Xe-CO2 Polyimide Wire Joint
Current – 1.4 A Charge ~ 3.3 C/cm Exposed Time – 672 hrs Target Flow Rate ~15 cc/hr C deposits Jack Fowler, Duke HEP

37 IU Wire 2 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current – 1.4 A Charge ~ 3.3 C/cm Exposed Time – 672 hrs Target Flow Rate ~15 cc/hr Few pores Good surface grain definition Jack Fowler, Duke HEP

38 IU Wire 2 Segment 7 Gas Volume - Xe-CO2 Polyimide Wire Joint
Current – 1.4 A Charge ~ 3.3 C/cm Exposed Time – 672 hrs Target Flow Rate ~15 cc/hr More C deposits than in earlier segments Jack Fowler, Duke HEP

39 IU Wire 2 Segment 7 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current – 1.4 A Charge ~ 3.3 C/cm Exposed Time – 672 hrs Target Flow Rate ~15 cc/hr More C deposits than in earlier segments Loss of grain definition from segment 4 Jack Fowler, Duke HEP

40 IU Wire 18 Segment 4 Gas Volume - Xe-CO2 -CF4 No Wire Joint
Current – 1.7A Charge ~ 2.4 C/cm Exposed Time – 408 hrs Target Flow Rate ~15 cc/hr Large C deposits Jack Fowler, Duke HEP

41 IU Wire 18 Segment 5 Gas Volume - Xe-CO2 -CF4 No Wire Joint
Current – 1.7A Charge ~ 2.4 C/cm Exposed Time – 408 hrs Target Flow Rate ~15 cc/hr Large C deposits Some large pores Jack Fowler, Duke HEP

42 IU Wire 18 Segment 5 Gas Volume - Xe-CO2 -CF4 No Wire Joint
Current – 1.7A Charge ~ 2.4 C/cm Exposed Time – 408 hrs Target Flow Rate ~15 cc/hr Some loss of grain definition Jack Fowler, Duke HEP

43 IU Wire 19 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current – 1.7A Charge ~ 4.0 C/cm Exposed Time – 672 hrs Target Flow Rate ~15 cc/hr C deposits Some small pores Surface is smoother than wire 18 Jack Fowler, Duke HEP

44 IU Wire 19 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current – 1.7A Charge ~ 4.0 C/cm Exposed Time – 672 hrs Target Flow Rate ~15 cc/hr Slight decrease in grain definition Some small pores Jack Fowler, Duke HEP

45 IU Wire 19 Segment 5 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current – 1.7A Charge ~4.0 C/cm Exposed Time – 672 hrs Target Flow Rate ~15 cc/hr Surface has many small C deposits Some porosity Jack Fowler, Duke HEP

46 IU Wire 19 Segment 5 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current – 1.7A Charge ~ 4.0 C/cm Exposed Time – 672 hrs Target Flow Rate ~15 cc/hr Small pores around grain boundaries Some porosity Jack Fowler, Duke HEP

47 IU Wire 39 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current – 1.7A Charge ~ 4.9 C/cm Exposed Time – 816 hrs Target Flow Rate ~15 cc/hr Surface smooth in appearance Many large C deposits Jack Fowler, Duke HEP

48 IU Wire 39 Segment 4 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current – 1.7A Charge ~ 4.9 C/cm Exposed Time – 816 hrs Target Flow Rate ~15 cc/hr Many C deposits Loss of grain definition Jack Fowler, Duke HEP

49 IU Wire 39 Segment 5 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current – 1.7A Charge ~ 4.9 C/cm Exposed Time – 816 hrs Target Flow Rate ~15 cc/hr Surface smooth in appearance Large C deposits Jack Fowler, Duke HEP

50 IU Wire 39 Segment 5 Gas Volume - Xe-CO2 -CF4 Polyimide Wire Joint
Current – 1.7A Charge ~ 4.9 C/cm Exposed Time – 816 hrs Target Flow Rate ~15 cc/hr Surface is smoother Less grain definition C deposits Jack Fowler, Duke HEP

51 Summary It is clear that the wire is damaged in Duke wires and the surface has changed in Indiana wires Wire damage may be more a function of time exposed to gas as opposed to the amount of accumulated charge Duke wires have > double the exposure time IU wires have higher accumulated charge Xe-CO2 wire only exhibit small pores on surface Xe-CF4-CO2 wires show some heavy damage, both Au removal and deposits There is trace fluorine detected on the surface of the wire Jack Fowler, Duke HEP

Download ppt "SEM Analysis of Wire from Aging Test #7 at Duke University"

Similar presentations

The Periodic Table Dmitri Mendeleev –designed periodic table in which the elements were arranged in order of increasing atomic mass Henry Moseley –designed.

The Periodic Table Dmitri Mendeleev –designed periodic table in which the elements were arranged in order of increasing atomic mass Henry Moseley –designed.
1 Adhesion and Etching of Nickel-Chromium Tiecoat on Adhesiveless Flexible Laminate by Bergstresser, T., Hilburn, R. and Wang, J. Gould Electronics Gould.

1 Adhesion and Etching of Nickel-Chromium Tiecoat on Adhesiveless Flexible Laminate by Bergstresser, T., Hilburn, R. and Wang, J. Gould Electronics Gould.
Focused ion beam (FIB) 1.Overview. 2.Ion source and optics. 3.Ion-solid interaction, damage. 4.Scanning ion beam imaging. ECE 730: Fabrication in the nanoscale:

Focused ion beam (FIB) 1.Overview. 2.Ion source and optics. 3.Ion-solid interaction, damage. 4.Scanning ion beam imaging. ECE 730: Fabrication in the nanoscale:
FSC-5178 FIGURE 1. PHOTOGRAPHS OF FRONT AND BACK OF SUB-PANEL AFTER SOLDER PASTED WITH SAC305 AND REFLOWED a). Front side of sub-panel b). Back side of.

FSC-5178 FIGURE 1. PHOTOGRAPHS OF FRONT AND BACK OF SUB-PANEL AFTER SOLDER PASTED WITH SAC305 AND REFLOWED a). Front side of sub-panel b). Back side of.
26 September 2000 High Voltage Plates and Capacitors Jack Fowler.

26 September 2000 High Voltage Plates and Capacitors Jack Fowler.
299 Analysis For data: 299step.xlsx, 299.pxp. Summary of 299 1.Nb (15nm)/Al 2 O 3 (15nm Pad;4-0nm wedge)/Co(30nm) 2.Try to etch Nb with CF 4 3.Nb etch.

299 Analysis For data: 299step.xlsx, 299.pxp. Summary of Nb (15nm)/Al 2 O 3 (15nm Pad;4-0nm wedge)/Co(30nm) 2.Try to etch Nb with CF 4 3.Nb etch.
Study of sputtering on thin films due to ionic implantations F. C. Ceoni, M. A. Rizzutto, M. H. Tabacniks, N. Added, M. A. P. Carmignotto, C.C.P. Nunes,

Study of sputtering on thin films due to ionic implantations F. C. Ceoni, M. A. Rizzutto, M. H. Tabacniks, N. Added, M. A. P. Carmignotto, C.C.P. Nunes,
Y. Ueda, M. Fukumoto, H. Kashiwagi, Y. Ohtsuka (Osaka University)

Y. Ueda, M. Fukumoto, H. Kashiwagi, Y. Ohtsuka (Osaka University)
X Ray Flouresence Analysis (XRF). XRF X-Ray Fluorescence is used to identify and measure the concentration of elements in a sample X-Ray Fluorescence.

X Ray Flouresence Analysis (XRF). XRF X-Ray Fluorescence is used to identify and measure the concentration of elements in a sample X-Ray Fluorescence.
University of Illinois Optical and Discharge Physics ETCH PROFILES IN SOLID AND POROUS SiO 2  Solid  Porosity = 45 % Pore radius = 10 nm  Porous SiO.

University of Illinois Optical and Discharge Physics ETCH PROFILES IN SOLID AND POROUS SiO 2  Solid  Porosity = 45 % Pore radius = 10 nm  Porous SiO.
TEM Prep using FIB and Kleindiek Micro-Manipulator General Reminders, Tips and Tricks When in FIB view, work quickly to do what is needed and then freeze.

TEM Prep using FIB and Kleindiek Micro-Manipulator General Reminders, Tips and Tricks When in FIB view, work quickly to do what is needed and then freeze.
26 September 2000 Wire Procurement and Wire Joint Production Jack Fowler.

26 September 2000 Wire Procurement and Wire Joint Production Jack Fowler.
May’02, TRT Workshop Jack Fowler – Duke University SEM Analysis of Radiation Test Samples at Duke University Jack Fowler.

May’02, TRT Workshop Jack Fowler – Duke University SEM Analysis of Radiation Test Samples at Duke University Jack Fowler.
Chiho Wang ATLAS TRT Duke University CERN, Feb. 2005 1 TRT Barrel assembly status & schedule Feb. 9, 2005.

Chiho Wang ATLAS TRT Duke University CERN, Feb TRT Barrel assembly status & schedule Feb. 9, 2005.
 Electricity is caused by the flow (or net movement) of Electrons  Electric Current – the rate that positive charges flow in a circuit › Actually a.

 Electricity is caused by the flow (or net movement) of Electrons  Electric Current – the rate that positive charges flow in a circuit › Actually a.
First results of an aging test of a full scale MWPC prototype for the LHCb muon system Workshop on “Aging Phenomena in Gaseous Detectors”, October 2-5.

First results of an aging test of a full scale MWPC prototype for the LHCb muon system Workshop on “Aging Phenomena in Gaseous Detectors”, October 2-5.
MICROSCOPES As tools for the biologist. How are microscopes useful? They are used to extend human vision by making enlarged images of objects. They are.

MICROSCOPES As tools for the biologist. How are microscopes useful? They are used to extend human vision by making enlarged images of objects. They are.
May 2001, Istanbul Workshop High Voltage Plates and Capacitor Status Jack Fowler.

May 2001, Istanbul Workshop High Voltage Plates and Capacitor Status Jack Fowler.
NANO 225 Micro/NanoFabrication Electron Microscopes 1.

NANO 225 Micro/NanoFabrication Electron Microscopes 1.
31 May 2006Update ageing measurements at NIKHEF - LHCb week - Niels Tuning 1/37 Update ageing measurements at NIKHEF 31 May 2006 Niels Tuning, Gras van.

31 May 2006Update ageing measurements at NIKHEF - LHCb week - Niels Tuning 1/37 Update ageing measurements at NIKHEF 31 May 2006 Niels Tuning, Gras van.

Similar presentations

Ads by Google