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T2K Run8 MUMON Summary.

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Presentation on theme: "T2K Run8 MUMON Summary."— Presentation transcript:

1 T2K Run8 MUMON Summary

2 troubles, setting changes
proton beam bunch width increased from run : timing offset adjusted frequent timing error run : timing fix applied timing module replacement, delay changed by 15ns from run : timing offset adjusted IC attenuator 0dB  6dB from Run710098 EMTs installed ver.2, 3 : from Run71 ver.4 : from run74

3 history plots Run70,72,73,74 Run71 BSD files BSD is not reprocessed
use updated one instead of BSD

4 profile center X stable within 2 cm Si & IC are consistent
anti-correlation w/ proton beam position

5 profile center Y stable within 3 cm Si & IC are consistent
anti-correlation w/ proton beam position

6 SSEM – Si correlation w/ angle corr.

7 profile width X 2~3 cm fluctuation Si & IC are consistent
correlated w/ proton beam width

8 profile width Y 2~3 cm fluctuation Si & IC are consistent
correlated w/ proton beam width

9 Si/CT history Horn PS current correction works very well
w/ Horn PS correction Horn PS current correction works very well slightly decreasing after the correction ?

10 IC/CT history Horn PS current correction works very well
w/ Horn PS correction calibration run (IC is 25cm displaced) attenuator 0dB  6dB Horn PS current correction works very well slightly increasing after the correction ?

11 Si/IC history IC attenuator 0dB  6dB Si / IC is gradually decreasing

12 investigation of Si yield decrease

13 run by run mean value history
use run>= ( IC attenuator setting change ) same vertical scales (2% full range)

14 run by run mean value history
use run>= ( IC attenuator setting change ) linear decrease  can be a radiation damage degradation rate ~ 1% / 5x1020 POT

15 bunch by bunch yield 1st bunch yield is decreasing faster
1st bunch 2nd bunch 3rd bunch 4th bunch 5th bunch 6th bunch 7th bunch 8th bunch 1st bunch yield is decreasing faster suggesting increase of tail (slow) component IC 8th bunch is saturating as beam power increase

16 proton beam bunch width
bunch width affects Si/CT or Si/IC checked CT pulse width 50% of peak FWHM 10% of peak rise time decay time

17 proton beam bunch width
drastic change on Nov.24 (run071058) variation after run71 is not monotonically cannot be a main reason of Si yield decrease

18 waveform comparison selected runs which have similar CT5 pulse width
1st bunch waveform normalized by CT5 1st bunch ppp averaged waveform (~1300shots), timing adjusted Run date power CT5 FWHM rise time 710229 Dec. 16 430 kW 94.8 ns 66.0 ns 720053 Jan. 17 440 kW 96.4 ns 66.5 ns 730034 Mar. 13 96.2 ns 65.7 ns 740035 Apr. 9 450 kW 95.2 ns 65.1 ns

19 CT5 waveform run710229 run720053 run730034 run740035

20 IC center ch waveform run710229 run720053 run730034 run740035

21 Si center ch waveform run710229 run720053 run730034 run740035 pulse height of Si signal is gradually decreasing

22 backup

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