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Power Consumption Change Requests

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Presentation on theme: "Power Consumption Change Requests"— Presentation transcript:

1 Power Consumption Change Requests
January 2995 doc.: IEEE /1215r1 January 2006 Date: Power Consumption Change Requests Authors: Name Company Address Phone Craig Warren Freescale 16644 West Bernardo Drive San Diego ca ext 1438 Notice: This document has been prepared to assist IEEE It is offered as a basis for discussion and is not binding on the contributing individual(s) or organization(s). The material in this document is subject to change in form and content after further study. The contributor(s) reserve(s) the right to add, amend or withdraw material contained herein. Release: The contributor grants a free, irrevocable license to the IEEE to incorporate material contained in this contribution, and any modifications thereof, in the creation of an IEEE Standards publication; to copyright in the IEEE’s name any IEEE Standards publication even though it may include portions of this contribution; and at the IEEE’s sole discretion to permit others to reproduce in whole or in part the resulting IEEE Standards publication. The contributor also acknowledges and accepts that this contribution may be made public by IEEE Patent Policy and Procedures: The contributor is familiar with the IEEE 802 Patent Policy and Procedures < ieee802.org/guides/bylaws/sb-bylaws.pdf>, including the statement "IEEE standards may include the known use of patent(s), including patent applications, provided the IEEE receives assurance from the patent holder or applicant with respect to patents essential for compliance with both mandatory and optional portions of the standard." Early disclosure to the Working Group of patent information that might be relevant to the standard is essential to reduce the possibility for delays in the development process and increase the likelihood that the draft publication will be approved for publication. Please notify the Chair as early as possible, in written or electronic form, if patented technology (or technology under patent application) might be incorporated into a draft standard being developed within the IEEE Working Group. If you have questions, contact the IEEE Patent Committee Administrator at Craig Warren Freescale DJ Shyy, MITRE

2 January 2995 doc.: IEEE /1215r1 January 2006 Introduction This document will cover some change requests to the existing methodology 6.16 Power Consumption. The way it is written it wont allow users that are doing low power consumption to be able to test. Another issue is to make some generic statements so however one decides to measure I, V it will be acceptable. Lastly, adding some modifiers to make the test more inclusive. Craig Warren Freescale DJ Shyy, MITRE

3 January 2995 doc.: IEEE /1215r1 January 2006 Change Requests 6.16 Power consumption Not everyone will want to use an Oscilloscope to measure voltage and current with. Remove all instances of Oscilloscope throughout Paragraph 6.16 and replace with the text with Current / Voltage Measurement Device with a sample rate of less than or equal to 1mS. The reason for doing this is to make it more generic. Change figure is Under change Figure 53 block marked test controller from “ Control of Digital Oscilloscope” to“Control of voltage and current measurement device”. In Figure 53 change the block marked “Digital Oscilloscope” to be Current and Voltage measurement device. Craig Warren Freescale DJ Shyy, MITRE

4 Change Requests 6.16.2.4 Special capabilities necessary for this test
January 2995 doc.: IEEE /1215r1 January 2006 Change Requests Special capabilities necessary for this test change the Block Diagram in Figure 55 not to be PS Battery but supply voltage from the interface bus “be it mPCI, PCI, Compact Flash, SDIO ect…Again more generic. Also change this to be more generic in configuration not all methods are used with probe. Some Vendors use extenders that breakout the V signals and have the capacity to feed that into a high sampling meter 2 channels. So Remove all reference to probe points and replace with measurement insertion locations. Remove any reference to current probe /probes utilization and replace with Current measurement device. “Testing could be done in various methods like bed of nails, extender cards with feed through ect… Craig Warren Freescale DJ Shyy, MITRE

5 January 2995 doc.: IEEE /1215r1 January 2006 Change Requests Permissible error margins and reliability of test Change the expected error margins for the test results are as follows, depending on the operation mode: Remove “The oscilloscope probes should be calibrated such that voltage measurement accuracy is less than 10 mV and the current measurement accuracy is less than 0.5 mA.” Replace with “The I/V measurement device should be calibrated such that voltage measurement accuracy is less than 1% of measured voltage and the current measurement accuracy is less than 5% of measured current” Craig Warren Freescale DJ Shyy, MITRE

6 Change Requests Add the following Modifiers to 6.16.3.1.2:
January 2995 doc.: IEEE /1215r1 January 2006 Change Requests Add the following Modifiers to : Beacon Interval mS “need to find what the TU are” Data Rates B=1-11, G=1-54, A=6-54 Should be forced so each modulation scheme can be measured. Reason for this is Average consumption for someone sitting at a 6mbps rate transferring a large file vs someone sitting at 54mbps distance transferring a large file. 6mbps is on longer and thus TX and RX longer between idle time. In these user case scenarios are we measuring the right thing should we be measuring current per bit? Zoom view Definition of Zoom view is a high sample resolution view of the current consumption trace over short duration of time. Add comment “ if test is intended to enable this feature a sample rate of less than 1mS shall be used and continuous data shall be represented in graph form. Craig Warren Freescale DJ Shyy, MITRE

7 Discussion points ? Issues or concerns? January 2006 January 2995
doc.: IEEE /1215r1 January 2006 Discussion points ? Issues or concerns? Craig Warren Freescale DJ Shyy, MITRE


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