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Dispersive Comb-Spectrum Interferometer: Metrological Characterization
Wiroj Sudatham Industrial Metrology Program KMUTT 17/01/2006 Umberto Minoni, Luigi Rovati, M. Bonardi, and Franco Docchio (Owner) IEEE TRANSACTION ON INSTRUMENTATION AND MEASUREMENT, VOL. 48, NO. 6, DECEMBER 1999
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Objective & Scope Introduction to DSCI Principle of measurement
Analytical of uncertainty sources Experimental Results Modeling tools for nonincremental distance measurement Low-cost implementation, using a commercial low-cost laser diode Analytical uncertainty sources Application for the development industrial sensors 4/7/2019 Seminar – S. Wiroj DSCI - Introduction
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Introduction Interferometer
Tools, widely used in nonincremental distance measurement Many type (difference component) Interference of light waves Principle of superposition Coherence light source Light Sources (normally used laser) 4/7/2019 Seminar – S. Wiroj DSCI - Introduction
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Introduction Dispersive Comb Spectrum Interferometer - DCSI
Michelson’s Interferometer System White Light (LD 670 nm) Diffraction Grating Littrow Configuration 4/7/2019 Seminar – S. Wiroj DSCI - Introduction
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Introduction Why DCSI ? Easy to optical setup and mechanical moving parts Robust and reliable configurations high-accuracy Using a commercial low cost laser diode as the light source 4/7/2019 Seminar – S. Wiroj DSCI - Introduction
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Principle Of Measurement
Measurement Setup RM MM LD MM BS1 CCD CC TC BS2 L1 L2 Littrow Configuration DG 4/7/2019 Seminar – S. Wiroj DSCI – Principle Of Measurement
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Principle Of Measurement
The CCD Camera for the spectral component detection and transfer to computer Littrow configuration exhibits adequate spectral resolution to study interference phenomena of each lasing modes 4/7/2019 Seminar – S. Wiroj DSCI – Principle Of Measurement
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The interference signal Simulated signal at the
Principle Of Measurement Signal processing The interference signal before sampling Simulated signal at the output of the camera The distance to be measured S can be evaluated by gauging the period Tcos The sampling frequency is given by the spectral frequency of the lasing modes 4/7/2019 Seminar – S. Wiroj DSCI – Principle Of Measurement
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Uncertainty Sources Two main cases Light source and its controls
Line width of each lasing modes The value of center frequency Optical setup including the detection of the interference signal Drift from the diffraction grating Drift from the CCD detection 4/7/2019 Seminar – S. Wiroj DSCI – Uncertainty Sources
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not be easily calculated
Uncertainty Sources Uncertainty Model not be easily calculated mapping optical freq onto the time scale of the camera signal Where, Assuming a negligible change of air refractive index 4/7/2019 Seminar – S. Wiroj DSCI – Uncertainty Sources
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Experiment Results Laser Characterization The best condition
Operating at 43 mA Temperature in the range from 8 oC to 14 oC 4/7/2019 Seminar – S. Wiroj DSCI – Experiment Results
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Experiment Results Laser Characterization Fringes visibility
if not, no aliasing phenomena are present The range of measurement should be Experiment result 4/7/2019 Seminar – S. Wiroj DSCI – Experiment Results
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Experimental Results Numerical Case Uncertainty Components
= Data be used A numerical estimate of the measurement uncertainty Used data from prototype implementation and Laser source characterization The combined uncertainty of the measuring range 800 mm corresponding to about 1.4 mm 4/7/2019 Seminar – S. Wiroj DSCI – Experiment Results
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Experiment Results Distance Measurements Operating at 8 oC 42 mA
Environment 22 oC SD of error is 1.3 mm Calibration a implementation of the system with interferometer traced to international standard The sensitivity to l0 , that the laser has a temperature coefficient of 0.39 nm/oC 4/7/2019 Seminar – S. Wiroj DSCI – Experiment Results
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Conclusion Supportable both theory and experimental results
Suitable to carry out measurement over up to about 1 mm Uncertainty of 0.18% Low-cost commercial source Application for the development of industrial sensors. 4/7/2019 Seminar – S. Wiroj DSCI – Conclusion
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THANK YOU FOR ATTENTION.
THE END. Presentation by S. Wiroj Dispersive Come-Spectrum Interferometer: Metrological Characterization AND THANK YOU FOR ATTENTION. Umberto Minoni, Luigi Rovati, M. Bonardi, and Franco Docchio (Owner) 4/7/2019 IEEE TRANSACTION ON INSTRUMENTATION AND MEASUREMENT, VOL. 48, NO. 6, DECEMBER 1999
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