1. Electrical Testing at UCSB: Hybrids, Modules, & Rods
Anthony Affolder
On behalf of the UCSB testing group

2. Testing personnel at UCSB
Professors
Joe Incandela
Claudio Campagnari
Post-docs
Anthony Affolder
Patrick Gartung (UC-Riverside)
Russell Taylor
Graduate Students
Steve Levy
( now University of Chicago)
Jim Lamb
Brad Patterson
(returning this summer)
Electrical Engineering Support
Sam Burke
Mechanical Engineering Support
David Hale
Dean White
Undergraduates
Derek Barge (B.S. Physics)
Chris McGuinness
Lance Simms (B.S. Physics)
Joined group since February, 2003

3. Faulty Channel Sources
Fault Sources (excluding cable breaks and CMN)
Hybrid-0.012%
Sensor (in DB)-0.33%
Sensor (not in DB)-0.19%
Either high noise and/or visible sensor damage
Bonding-0.034%
Mostly due to early pitch-adaptors (RMT).
No problems seen with production pitch-adaptors (PLANAR).
Testing-0.049%
Mostly due to an early problem which has been alleviated
Total faults – 0.63%
We introduce only 0.095% bad channels per modules on average
Grade A Grade B Grade C

4. Fault Finding Using ARCS (3)
Test failures are correlated in order to diagnose fault type
Open (1 or 2 sensor)
Short
Pinhole/Saturated Channel
Noisy Channels
Mid-sensor opens
Faults are found >99% with correct fault type identified ~90% of the time
Misidentification is almost always between 1 or 2 sensor opens
Less than .1% of good channel flagged as faulty
As more modules are built, fault finding criteria will be re-tuned to improve performance
Integrated into ARCS software by Aachen
Database output of module testing is being finalized
Similar tuning of fault finding underway for DAQ-based systems
Led by Patrick Gartung (UC-Riverside)