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SASE FEL PULSE DURATION ANALYSIS FROM SPECTRAL CORRELATION FUNCTION
FEL Conference 2011 Shanghai, 24. August. 2011 Alberto Lutman Jacek Krzywinski, Yuantao Ding, Yiping Feng, Juhao Wu, Zhirong Huang, Marc Messerschmidt
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X-ray pulse duration measurement
Collection Shot-by-shot spectra Average time profile T -5 5 6 12 18 We recover the average x-ray time profile length T from a collection of single shot spectra FEL Conference 2011 Shanghai, 24.August.2011
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Model description Electron beam current:
are independent random variables with probability density SASE FEL Amplifier in linear regime: time independent time dependent FEL Conference 2011 Shanghai, 24.August.2011
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Model description Electric field spectrum: Average x-ray profile:
First and second order correlations FEL Conference 2011 Shanghai, 24.August.2011
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Model description First and second order correlations functions
Valid in the linear regime For non-linear regime, we run numerical simulations FEL Conference 2011 Shanghai, 24.August.2011
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Model description Correlation of the intensity at the exit of the spectrometer Intensity spectrum at frequency Central frequency of amplification FEL Conference 2011 Shanghai, 24.August.2011
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Procedure to calculate G2
Single-shot Spectrum For each collected spectrum Average on many shots And normalization Average Spectrum FEL Conference 2011 Shanghai, 24.August.2011
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G2 function for different X(t) profiles
relative FEL bandwidth We assume that the spectrometer has Gaussian resolution function relative rms spectrometer resolution To find an analytical expression for G2 we need just to plug in the X(t) average profile FEL Conference 2011 Shanghai, 24.August.2011
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G2 with Gaussian profile
* * X-ray beam profile # # FEL Conference 2011 Shanghai, 24.August.2011
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G2 with flat top profile * * ° ° X-ray beam profile G2 # #
FEL Conference 2011 Shanghai, 24.August.2011
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Non stationary w0 and FEL gain jitter
Central frequency jitters with Gaussian law with rms FEL Conference 2011 Shanghai, 24.August.2011
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Non stationary w0 and FEL gain jitter
Shot to shot gain as random variable with average at correlate spectral intensities at FEL Conference 2011 Shanghai, 24.August.2011
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Numerical simulations
1) Verify that relations hold well enough in saturation 2) Recover bunch length and spectrometer resolution electron bunch Short bunch Wavelength 0.8 nm Undulator period 3 cm Long bunch FEL Conference 2011 Shanghai, 24.August.2011
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Verify relation FEL Conference 2011 Shanghai, 24.August.2011
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Simulated measurements results
Retrieved spectrometer resolutions Long bunch Short bunch FEL Conference 2011 Shanghai, 24.August.2011
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Experimental results Experimental demonstration performed at LCLS
Photon energy 1.5 keV Electron charge 250 pC Different undulator length Different peak current Controlling lasing part of electron bunch with slotted foil FEL Conference 2011 Shanghai, 24.August.2011
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Different undulators distance
Measured spectrometer relative resolution sm Electron bunch length Measured x-rays are shorter than the electron bunch FEL Conference 2011 Shanghai, 24.August.2011
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Different peak currents
Measured x-rays pulse durations are consistent with electron bunch length change. FEL Conference 2011 Shanghai, 24.August.2011
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Slotted foil measurements
Electron bunch FWHM x-ray FWHM 10 fs 13 fs 18 fs 24 fs 27 fs 39 fs 56 fs 52 fs FEL Conference 2011 Shanghai, 24.August.2011
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Thank you for your attention
FEL Conference 2011 Shanghai, 24.August.2011
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Flat top vs Gaussian G2 We cannot distinguish between:
- Gaussian profile with rms length - Flat Top profile with full length With these x-ray profiles we cannot distinguish distrubutions with same rms FEL Conference 2011 Shanghai, 24.August.2011
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Double horn profile FEL Conference 2011 Shanghai, 24.August.2011
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Double horn profile Closed form is Straightforward, but long to write
Oscillation period Depends on distance between the horns Interaction diminishes for longer separation Closed form is Straightforward, but long to write FEL Conference 2011 Shanghai, 24.August.2011
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Simulations with peak current jitter
The multiplicative effect of the statistical gain is in accord with the derived formula After saturation, the effect is much less relevant FEL Conference 2011 Shanghai, 24.August.2011
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Another numerical simulation
Full Length = 10 mm Radiation Wavelength = 1.5 A r = 4.5 x 10-4 Gain Length = 2.98 m Undulator Length = 100 m Number of Shots = 2000 Total Slippage Length = 0.5 mm Simulation Parameters FEL Conference 2011 Shanghai, 24.August.2011
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Another numerical simulation
At Saturation Deep Saturation Exponential Growth FEL Conference 2011 Shanghai, 24.August.2011
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Another numerical simulation
z=30m Linear regime Agreement: |X(w-w’)| analytical |g1(w-w’)| simulated z=100m Deep saturation z=60m saturation FEL Conference 2011 Shanghai, 24.August.2011
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Another numerical simulation
Agreement: Z=30m Linear regime g2(w-w’) simulated 1+|g1(w-w’)|2 simulated Z=60m saturation Z=100m Deep saturation FEL Conference 2011 Shanghai, 24.August.2011
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Fourier analysis of G2 function
Only Only X(t) FEL Conference 2011 Shanghai, 24.August.2011
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Fourier analysis for double horn
Gaussian in 0 Gaussian in 0 Gaussian in Triangle in 0 FEL Conference 2011 Shanghai, 24.August.2011
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Camera background noise
Impact on the number of modes (w1 = w2) small Background must be removed accurately Impact on the offset (|w1 - w2| large) FEL Conference 2011 Shanghai, 24.August.2011 Can eventually go to 0
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