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Antonio Plaza University of Extremadura. Caceres, Spain

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Presentation on theme: "Antonio Plaza University of Extremadura. Caceres, Spain"— Presentation transcript:

1 Automated Image Registration Using Morphological Region of Interest Feature Extraction
Antonio Plaza University of Extremadura. Caceres, Spain Jacqueline Le Moigne NASA Goddard Space Flight Center, USA Nathan Netanyahu Bar-Ilan University, Israel & University of Maryland, USA

2 Earth Science Data Integration
Automatic Multiple Source Integration Prediction Models Satellite, Aircraft and Field Data Improved Data Sets Validation & Verification Feedback Design of Future Intelligent Sensor Webs

3 What is Image Registration ?
Navigation or Model-Based Systematic Correction Orbital, Attitude, Platform/Sensor Geometric Relationship, Sensor Characteristics, Earth Model, ... Image Registration or Feature-Based Precision Correction Navigation within a Few Pixels Accuracy Image Registration Using Selected Features (or Control Points) to Refine Geo-Location Accuracy 2 Approaches: (1) Image Registration as a Post-Processing (Taken here) (2) Navigation and Image Registration in a Closed Loop

4 Image Registration Challenges
Multi-Resolution / Mono- or Multi-Instrument Multi-temporal data Various spatial resolutions Various spectral resolutions Sub-Pixel Accuracy 1 pixel misregistration=> 50% error in NDVI computation Accuracy Assessment Synthetic data "Ground Truth" (manual registration?) Use down-sampled high-resolution data Consistency ("circular" registrations) studies

5 Image to Image Registration
• Multi-Temporal Image Correlation • Landmarking • Coregistration Image Characteristics (Features) Extraction Feature Matching Incoming Data Compute Transform

6 Image to Map Registration
Input Data Masking and Feature Extraction Feature Matching Compute Transform Map

7 Multi-Sensor Image Registration
ETM/IKONOS Mosaic of Coastal VA Data ETM+ IKONOS

8 Image Registration Components
Pre-Processing Cloud Detection, Region of Interest Masking, ... Feature Extraction (“Control Points”) Edges, Regions, Contours, Wavelet Coefficients, ... Feature Matching Spatial Transformation (a-priori knowledge) Search Strategy (Global vs Local, Multi-Resolution, ...) Choice of Similarity Metrics (Correlation, Optimization Method, Hausdorff Distance, ...) Resampling, Indexing or Fusion

9 UTM of 4 Scene Corners Known from Systematic Correction
Image Registration Subsystem Based on a Chip Database UTM of 4 Scene Corners Known from Systematic Correction Landmark Chip Database (1) Find Chips that Correspond to the Incoming Scene (2) For Each Chip, Extract Window from Scene, Using UTM of: - 4 Approx Scene Corners - 4 Correct Chip Corners (3) Register Each (Chip,Window) Pair and Record Pairs of Registered Chip Corners (4) Compute Global Registration from Multiple Local Ones (5) Compute Correct UTM of 4 Scene Corners of Input Scene Correct UTM of 4 Chip Corners Input Scene

10 UTM of 4 Scene Corners Known from Systematic Correction
Image Registration Subsystem Based on Automatic Chip Extraction UTM of 4 Scene Corners Known from Systematic Correction Input Scene Reference Scene (1) Extract Reference Chips and Corresponding Input Windows Using Mathematical Morphology (2) Register Each (Chip,Window) Pair and Record Pairs of Registered Chip Corners (refinement step) (3) Compute Global Registration from Multiple Local Ones (4) Compute Correct UTM of 4 Scene Corners of Input Scene Advantages: Eliminates Need for Chip Database Cloud Detection Can Easily be Included in Process Process Any Size Images Initial Registration Closer to Final Registration => Reduces Computation Time and Increases Accuracy.

11 Step 1: Chip-Window Extraction Using Mathematical Morphology
Mathematical Morphology (MM) Concept: Nonlinear spatial-based technique that provides a framework. Relies on a partial ordering relation between image pixels. In greyscale imagery, such relation is given by the digital value of image pixels Original image Greyscale MM Basic Operations: K K Structuring element (4-pixel radius Disk SE) Erosion Dilation

12 Step 1 (Cont.) Binary Erosion Structuring element Structuring element

13 Step 1 (Cont.) Binary Dilation Structuring element Structuring element

14 Step 1 (Cont.) K Greyscale Morphology: Combined Operations
e.g., Erosion + Dilation = Opening K

15 Step 1: Chip-Window Extraction Using Mathematical Morphology
Scale-Orientation Morphological Profiles (SOMP): From Openings and Closings with SEs=Line Segments of Different Orientations SOMP = Feature Vector D(x,y) at each Pixel (various scales & orientations) Entropy of D(x,y) = H(D(x,y)) Algorithm: a. Compute D(x,y) for each (x,y) in reference scene b. Extract reference chip centered around (x’,y’) with Max[H(D(x’,y’))], e.g. 256x256 c. Compute D(X,Y) for each (X,Y) in search area input scene centered (e.g., 1000x1000) around location (x’,y’) Compute RMSE(D(X,Y),D(x’,x’)) for all (X,Y) in search area Extract input window centered around (X’,Y’) with Min(RMSE) Return to step 2. until predefined number of chips is extracted

16 Step 1: Chip-Window Extraction Using Mathematical Morphology Results(Landsat-7/ETM+ Data - Central VA) 10 Chips Extracted from Reference Scene (Oct. 7, 1999) 10 Windows Extracted from Input Scene (Nov. 8, 1999)

17 Step 2: Chip-Window Refined Registration Using Robust Feature Matching
Reference Chip Input Window Wavelet Decomposition Robust Feature Matching (RFM) Using Hausdorff Distance Maxima Extraction Choice of Best Transformation At Each Level of { Overcomplete Wavelet-type Decomposition: Simoncelli Steerable Pyramid “Maxima” Extraction: Top 5% of Histogram

18 Step 2: Robust Feature Matching Using Hausdorff Distance
Search Transformation Space through Hierarchical Spatial Subdivisions Perform Monte Carlo Sampling of Control Points Compute Robust Similarity Measure k-th smallest squared distance to nearest neighbors, i.e., partial Hausdorff DistancePartial Hausdorff Distance: Hk(A, B) = Kth a in A minb in B dist (a,b) (1≤ k ≤ |A|; Kth is the kth smallest element of set; dist(a,b): Euclidean distance) Prune Search Space by "Range" Similarity Estimates Iterate and Refine on each Level of Wavelet Decomposition

19 Step 3: Compute Global Registration from All Local Registrations
From each Local Registration, Window-Chip: Corrected Locations of Four corners of Each Window i.e.: for each chip-window i, pair correspondences: (UL_i_X1,UL_i_Y1) to (UL_i_X2,UL_i_Y2) (UR_i_X1,UR_i_Y1) to (UR_i_X2,UR_i_Y2) (LL_i_X1,LL_i_Y1) to (LL_i_X2,LL_i_Y2) (LR_i_X1,LR_i_Y1) to (LR_i_X2,LR_i_Y2) Use of a Least Mean Square (LMS) Procedure to Compute Global Image Transformation (in pixels) If n chips, 4n points used for the LMS => Step 4: Use Global Transformation to Compute new UTM Coordinates for each of the 4 Corners of the Incoming Scene

20 Results of Global Registration On Landsat-7 VA Test Data

21 Conclusions Fully Automated System for Registration of Multi-Temporal Landsat Scenes of Any Size, Using Mathematical Morphology and Robust Feature Matching Techniques MM Chip-Window Extractor Can be Used with Any Other Registration Method Eliminates Need of Database Provides Close Initial Match => Follow-up Computations Faster and More Accurate Further Experimentation On-Going


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