1. Rad Hard Products for Satellites and Space

2. Rad Hard Products Manufactured on QML line, special epi Process
Only Re-Configurable Rad Hard FPGA
Manufactured on QML line, special epi Process
Utilize same geometries as non-rad Hard QML
devices to facilitate prototyping
Guaranteed radiation specs
Densities up to 130,000 system gates today

3. Total Ionizing Dose shift or degradation Co-60 source
Testing Performed at Lockheed, Sunnyvale CA.
Co-60 source
Per MIL-STD-883, Method 1019, except dose rate
Dose rate 35
Full specified Vdd, outputs tri-stated
Booted up with default initial configuration
Icc plotted vs dose during radiation stress
Full production testing within 60 minutes
60 Krads(si) with no parametric
shift or degradation

4. SEU/SEL Brookhaven National Labs, Upton, NY.
Heavy ion SEU/SEL tests performed at
Brookhaven National Labs, Upton, NY.
Lets up to 120MeV - cm2/mg
No latch - up @ +125°C
Low soft upset rates

5. IC Process - Thin, high quality gate oxide - Highly doped field oxide
Advanced 0.35m epitaxial CMOS process
- Thin, high quality gate oxide
- Highly doped field oxide
- Field implant in SRAM area
- 7um epi substrate

6. Class T Rad Hard Quality Requirements Defined in Mil - PRF - 38535
(QML)
Intended for satellite and similar applications
Does not replace class V space product
Supported by DSCC and JEDEC (G-12 and JC-13)
Product will be supplied to SMDs, with radiation (TID) guarantees

7. Calculated Upset Rates for LEO
Notes
1. Low Earth Orbit (LEO), 680 km, 98 inclination, 100 mil Al shielding
2. Heavy ion testing was performed on Xilinx XQR devices at Brookhaven National Laboratories. This data was used to calculate upsets from the galactic cosmic and solar flare environments.
3. Space Radiation 2.5 and CHIME models were used for the galactic and solar flare conditions.
4. Space Radiation 2.5 was used for the trapped radiation and proton contribution from the flares.

8. Calculated Upset Rates for GEO
Notes
1. Geostationary Earth Orbit (GEO), 35,000 km, 0 inclination, 100 mil Al shielding
2. Heavy ion testing was performed on Xilinx XQR devices at Brookhaven National Laboratories. This data was used to calculate upsets from the galactic cosmic and solar flare environments.
3. Space Radiation 2.5 and CHIME models were used for the galactic and solar flare conditions.
4. Space Radiation 2.5 was used for the proton contribution from the flares.

9. Single Event Upset Test
Conclusion:
398 upset (calculated) during a 5-year LEO mission 1,2,3,4
Statistically, one bit upset per 110 hrs in the 800, configuration latches
Notes:
1) 680 km, 98° inclination, 100 mil Al shielding with two 90% worst-case flares per year and one ALSF per mission
2) Heavy ion testing performed on Xilinx XQR devices at Brookhaven National Laboratories. This data
was used to calculate upsets from the galactic cosmic and solar flare environments.
3) Space Radiation 2.5 and CHIME models used for the galactic and solar flare conditions.
4) Space Radiation 2.5 used for the trapped radiation and proton contribution from the flares.

10. The XQR4000XL Family 3 Device Sizes
XQR4013XL (10K to 30K system gates)
XQR4036XL (20K to 65K system gates)
XQR4062XL (40K to 130K system gates)
Packages
Ceramic QFP - CB228
Plastic QFP, BGA, DIE
Temperature Range -55oC to +125oC Speed Grade over Military Temperature Range -1 over Commercial Temperature Range

11. XQR4000XL Radiation Specifications
Total Ionizing Dose Krads(si) QA monitor on every wafer lot
Latch-up Immune
LETth > oC
Soft Upset Rate (upsets/bit-day)
2.43E-8 (Galactic p+)1
9.54E-8 (Galactic Heavy Ion) 1
Note1: For Low Earth Orbit (LEO), 680 km, 98° inclination, 100 mils Al shielding

12. Virtex Rad Hard The Next Generation
Advanced 0.25m process total dose >100K Rads
Initial SEU evaluation in 1Q99
Product schedules:
XQVR XQVR XQVR1000
Q399 Q499 Q100

13. Radiation Hardened Product/Process Roadmap
13K to 62K Gates K to +1M Gates
Radiation testing to
be conducted in 1Q99
Product
Introduced
XQR4000XL
0.35
1M gates
62K gates
Virtex
XQV
>1M gates
0.25
XQVR
Virtex II
0.18
1998
1999
2000
2002 1

14. Documentation XQR Products Data Sheet
Single Event Effects Testing ( white paper)
Neutron Single Events (white paper)
Radiation Tolerance of High-Density FPGAs ( white paper)
Radiation Hardened Products Presentation Available at:

15. Rad - Hard Configuration Memories
E2PROM
- Northrop Grumman (formerly Westinghouse, Baltimore)
- W28C K (8K x 8)
- W28C K (32 x 8)
SRAM
Honeywell
- HLX M (128K x 8)
Austin
- MT5C1008XX - XXE (128K x 8)
- AS5C512K8XX - XXE (512K x 8)
SEI -