1. 2nd exam coverage X-ray sources lab rotating anode synchrotrons
Collimation
long slit
pinhole
Kratky design
new optics
Detectors - types and operation
Instrument systems
Sample preparation
thickness

2. 2nd exam coverage Scattering sources resolution issues deadtime
standards
No guarantee that each of above will be covered on exam
There will be a problem on the specimen preparation procedure and considerations for two different samples

3. Interpretation - summary so far
Dilute particulate system
radius of gyration
spheres
thin rods
thin discs
many other models
Guinier law
dense packing of spheres
Non-particulate 2-phase system
invariant
ideal 2-phase system
Porod law
deviations from ideal
diffuse boundary

4. Interpretation - summary so far
Periodic systems
separate order from disorder
ideal stack of lamellae
lamellae with variable thickness
use of correlation function