1. High Resolution Imaging structure and morphology phase heterogeneity & defects Electron Diffraction determine crystallography SAED CBED XEDS (energy-dispersive x-ray spectrometry) Si(Li) detector EELS (electron energy-loss spectroscopy) disperses electrons in energy elemental and chemical analysis EFTEM possible with an imaging energy filter HI-MAG Analytical Electron Microscopy

2. EELS vs. EDS courtesy Gatan EELS course

3. Analytical Electron Microscopy EFTEM Mn-C-O Map 25 nm 3 nm 3D imaging field emission STEM zeptoanalysis nano diffraction HRTEM 0.5 nm nanoparticles 3 um tomography EFTEM Mn-C-O Map 25 nm Valence mapping 3 nm 3D imaging field emission STEM zeptoanalysis nano diffraction HRTEM 0.5 nm nanoparticles 3 um 3D Monte Carlo chemical sinogram

4. 3D Reconstruction ideal assumed by software reality new software needed noise added to projections

5. Rubiks Cube O K map N K map Cu L map Al K map Si K map Ti K map Cu K map Al K map* *different contrast stretch RGB overlay Forward problem solved. Can we solve the inverse problem?