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A review of recent phase change memory developments

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1 A review of recent phase change memory developments
Guy Wicker Ovshinsky Innovation

2 Intel and Micron announce
3D XPoint Technology August 2015 IBM Announces MLC PRAM chip May 2016 OTS OMS

3 Nerve Impulse Paper June 15, 1955
Stanford Ovshinsky began research into 2 terminal switching devices in 1955 Nerve Impulse Paper June 15, 1955 Ovitron and RRAM development Ovitron 1959 RRAM Patent 1963

4 1964 Patent application on Te alloy switching Devices U. S
1964 Patent application on Te alloy switching Devices U.S. Patent Ovshinsky, S., “Reversible Electrical Switching Phenomena in Disordered Structures, ” Phys. Rev. Lett, V. 21, no. 20, pp , Nov. 11, 1968.

5 OTS isolated OMS memory was first reported at ECD in 1970
D. Nelson, Jan Helbers and Roy Shanks D.L. Nelson, “Ovonic Device Applications”, Journal Non-Crystalline Solids V2 pp , 1970. Prior art to much of 3D-XPoint’s IP

6 Ovonic Memory Inc. and Intel 256bit Phase Change Memory 1970
1976 ECD Burroughs JV 1024 bits Fully Decoded Ovonic Memory Inc. and Intel 256bit Phase Change Memory 1970 1972 Prototype

7 128X128X2 integrated OTS isolated OMS array
1987 128X128X2 integrated OTS isolated OMS array

8 Shortcomings of Memory
Speed ) Reset Current

9 Optical Disk Development 1984-1992
Rubin and Otah Compound materials for reversible, phase‐change optical data storage M. Chen, K. A. Rubin, and R. W. Barton, Applied Physics Letters 49, 502 (1986)

10 1991 Inadvertent Polymer film led to sub-2mA devices

11 1991 Device consistency allowed demonstration of Multilevel Storage

12 1991 First 225 electrically switched Phase Change Memory

13

14 The Ovonic Threshold Switch can be used to implement logic with
Higher speeds and more current drive than MOSFETs As an Isolation Element it can work with a wide variety of two terminal memories

15 Competitive Technologies

16 STT-MRAM FeRAM Will be employed in 3-8 years
Complex and expensive structure High speed and unlimited cycle life FeRAM Will be employed in 3-8 years high performance nonvolatile

17 ReRAM Unclear what mechanisms are involved Oxide vacancies - Neville Mott Difficult Forming Low Cycle Life CB-RRAM Conductive bridge of metal ions Very low cycle life


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