1. Status report
2014 Feb 21th

2. Status Analysis Others Slew correction
Efficiency of each angle section
22O runs
Beam Fraction
Beam Purity
Others
Cancel the hotel for JPS meeting
Go to RCNP on coming April
ARIS2014 abstract submitted

3. Slew Correction Conclusion:
the walk effect does not change the tof significantly
The resolution of tof increased because slew correction introduce charge uncertainty
The charge ratio vs TplaX has 2 locus.

4. MWDC efficiency
Due to acceptance, each plane does not cover the same area. It is very difficult to deduce the section efficiency.
Gate on central area, so the acceptance for each plane are the same.
The efficiency of each plane is so high
Using spin-up and down asymmetry for analyzing power deduction.
Count
Eff.
Y5_1
523
98.95%
Y5_2
185
99.63%
Y5_3
1452
97.13%
Y5_4
1543
96.96%
Y5_5
427
99.14%
Y5_6
1873
96.33%
From CM Y6
49169
Avg. eff.
98.01% Y5
6003
6+5 eff
99.43%

5. 22O runs Beam Fraction The beam trigger was turn on after run#20
The beam spot is similar for 23F and 22O
Beam fraction is ~ 40%

6. Todo (short term) Use clean data of 22O Run 24O data
Apply same gate as 14O analysis
PID downstream check
Redo FH9 tavg resolution by DC91
Require Time reference for SMWDC-S1 analysis
Nokyi, TTD, SMWDC-S1 and DCS0D