1. Coherent X-ray Imaging Instrument WBS 1.3
Sébastien Boutet
CXI Instrument Scientist
April 21, 2009

2. Coherent Diffractive Imaging of Biomolecules
One pulse, one measurement
Particle injection
LCLS pulse
Wavefront sensor or second detector
Noisy diffraction pattern
Combine many measurements into 3D dataset
Data Frames
Combined Data Set
Reconstruction

3. CXI Instrument Goals/Requirements
Perform imaging of single particles at highest spatial resolution achievable using single LCLS pulses
Image biological nanoparticles beyond the classical damage limit using single LCLS pulses
Global Requirements (SP )
Tailor and characterize X-ray beam parameters
Spatial Profile
Intensity
Repetition rate
Deliver the sample to the beam and control its environment
Key Performance Parameters
4-20 keV energy range
Using the fundamental and third harmonic
Set by LCLS beam
Particle Injector
nm size range

4. CXI Instrument Location
Near Experimental Hall
AMO
SXR
X-ray Transport Tunnel
XPP
CXI
Endstation
XCS
Source to Sample distance : ~ 440 m
Far Experimental Hall

5. Far Experimental Hall CXI Control Room Coherent X-ray Imaging
Lab Area
XCS Control Room
Hutch #6
X-ray Correlation Spectroscopy
Instrument
Coherent X-ray Imaging
Instrument

6. CXI Instrument Overview
Guard Slits
Requirement
Device
Remove X-ray beam halo
X-ray Guard Slits
Tailor X-ray intensity
Attenuators
Tailor X-ray repetition rate
Pulse Picker
Characterize X-ray pulse intensity
Intensity Monitor
Characterize X-ray spatial profile
Profile Monitor
Characterize X-ray focus
Wavefront Monitor
Align experiment without X-ray beam
Reference Laser
Maximize X-ray flux on sample
Tailor focal spot size to the sample
1 micron Kirkpatrick-Baez Mirrors
0.1 micron Kirkpatrick-Baez Mirrors
Minimize air scatter and background
Position sample and final apertures
Sample environment
Position sample environment
Instrument Stand
Deliver particles to the X-ray beam in
Particle Injector
Measure X-ray scattering pattern
2D X-ray Detector (Utilizing the LCLS Detector)
Position X-ray area detector
Detector Stage
Analysis of sample fragments after Coulomb explosion
Ion Time-of-Flight
Diagnostics
XRT
Photon Shutter
Attenuators
Pulse Picker
Reference Laser
Guard Slits
Diagnostics
Guard Slits
1 µm KB Mirrors
Diagnostics
Guard Slits
0.1 µm KB Mirrors
0.1 µm Sample Environment
Particle Injector
Ion TOF-MS
FEH Hutch 5
Detector Stage
Guard Slits
Diagnostics
1 µm Sample Environment
Particle Injector
Ion TOF-MS
Detector Stage
Wavefront Monitor
Beam Dump

7. CXI with 1 micron and Unfocused Beam
Optics
& Diagnostics
Optics
& Diagnostics
Diagnostics &
Wavefront Monitor
1 micron Sample
Environment
1 micron KB
Reference Laser

8. CXI with 0.1 micron Beam Optics, Diagnostics and Wavefront Monitor
0.1 micron KB &
Sample Environment
Reference Laser

9. CXI Instrument Overview
Particle injector
LCLS Beam
Sample Chamber
Precision Instrument Stand
Detector Stage

10. (available in 2012 or before)
Scope
Early Science Scope
(available 2011)
CD 4
(available in 2012 or before)
1 micron KB System
0.1 micron KB System
1 micron Sample Chamber
0.1 micron Sample Chamber
1 micron Instrument Stand
0.1 micron Instrument Stand
Detector Stage
Particle Injector
Reference Laser
Ion TOF
X-ray Slits
X-ray Attenuator/Pulse Picker
X-ray Diagnostics
X-ray Optics and Diagnostics Support Stands
Vacuum System
Controls & Data Systems
Hutch Facilities
X-ray Detector System