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PV Materials Global Technical Committee European Chapter Liaison Report March 11, 2019 v1.

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Presentation on theme: "PV Materials Global Technical Committee European Chapter Liaison Report March 11, 2019 v1."— Presentation transcript:

1 PV Materials Global Technical Committee European Chapter Liaison Report
March 11, 2019 v1

2 Meeting Information Last meeting Next meeting
November 13, 2018 SEMICON Europe, Munich, Germany Next meeting May 21, 2019 Berlin, Germany Example: Last meeting Tuesday, November 7, 2017 at the SEMI Standards NA Fall Meetings SEMI Headquarters, Milpitas, CA

3 Leadership C. Hagendorf (Fraunhofer Center for Solar Photovoltaics)
P. Wagner (Self)

4 Task Forces Int. PV Analytical Test Methods TF PV Ribbon TF (inactive)
Leaders: H. Gotts, Air Liquide, Chris Moore, Covalent Metrology PV Ribbon TF (inactive) Leader: U. Prischmann, Ulbrich PV Silicon Materials TF Leader: P. Wagner PV Materials Degradation TF Leaders: C. Hagendorf, FhG-CSP, M. Köntopp, Hanwha-Q-Cells

5 Int. Analytical Test Methods TF
No meeting at SEMICON Europa 2018

6 PV Ribbon TF Leader: U. Prischmann, Ulbrich Status “inactive”

7 PV Silicon Materials TF
Leader: P. Wagner Last Meeting: Nov 13, 2018, in conjunction with SEMICON Europa Ballot review: All passed. Reapproval of SEMI PV Specification for Marking of PV Silicon Brick Face and PV Wafer Edge Reapproval of SEMI PV Practice for Assigning Identification Numbers to PV Si Brick, Wafer and Solar Cell Manufacturers Reapproval of SEMI PV Test Method for In Line Measurement of Cracks in PV Silicon Wafers by Dark Field Infrared Imaging Reapproval of SEMI PV Test Method for In Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Using Multiple Line Segments Reapproval of SEMI PV Test Method for In Line, Noncontact Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Using Capacitive Probes Reapproval of SEMI PV Test Method for In Line Measurement of Lateral Dimensional Characteristics of Square and Pseudo Square PV Silicon Wafers Reapproval of SEMI PV Specification for Orientation Fiducial Marks for PV Silicon Wafers Reapproval of SEMI PV Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications

8 PV Materials Degradation TF
Leaders: C. Hagendorf, FhG-CSP, M. Köntopp, Hanwha-Q-Cells Last Meeting: Nov 13, 2018, in conjunction with SEMICON Europa Status of draft: Test Method for Silicon PV Materials for light-induced degradation (LID) 90% ready, undergoing final discussions To be authorized for ballot at next TC meeting, May 2019

9 <jamano@semi.org>
Thank you


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