1. Secondary Electron Emission and Photoemission Tests

2. Keithley Meters Keithley sourcemeters were delivered a few weeks ago
Finished initial programming in Labview to control these meters
We plan on attaching the meters to the system this week
We have configured the meters to control an applied voltage to the sample, which will allow us to vary the energy of the incident electrons
An applied positive voltage to the detector will allow better collection of secondary electrons
These voltage must be carefully tuned so that the primary electrons are not deflected away from the sample

3. SEE and LEEDS
We are currently investigating methods for pulsing the electron gun for the LEEDS setup
This should allow for the limited testing of some low conductivity materials
While the power supply does not have a method to pulse, it may be possible to redirect the beam

4. Photoemission There will be some delay for photoemission
This will involve some work within the XPS system, taking it offline.
Modification of the sample holder will be necessary to direct light from the source to the sample
Significant relocation of electrical equipment will be required
My primary concern at the moment will be SEE