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(A) X-ray diffraction powder pattern of (Top) SAC (solvent-assisted crystallized), (Middle) LG, and (Bottom) SG diF-TEG ADT spin-coated films at 153 K.

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Presentation on theme: "(A) X-ray diffraction powder pattern of (Top) SAC (solvent-assisted crystallized), (Middle) LG, and (Bottom) SG diF-TEG ADT spin-coated films at 153 K."— Presentation transcript:

1 (A) X-ray diffraction powder pattern of (Top) SAC (solvent-assisted crystallized), (Middle) LG, and (Bottom) SG diF-TEG ADT spin-coated films at 153 K (blue) and 233 K (red). (A) X-ray diffraction powder pattern of (Top) SAC (solvent-assisted crystallized), (Middle) LG, and (Bottom) SG diF-TEG ADT spin-coated films at 153 K (blue) and 233 K (red). (B) The (001) preferred orientation characteristic to SAC and LG films. (C) Mix of (001) and (111) molecular orientations present in SG films. Yaochuan Mei et al. PNAS doi: /pnas ©2017 by National Academy of Sciences


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