1. Atomic force microscopy system showing the cantilever tip that was used to estimate properties of the cuticle substrate.
Atomic force microscopy system showing the cantilever tip that was used to estimate properties of the cuticle substrate. (A) Schematic diagram showing the indentation mode in AFM used to quantify the material properties of the substrate. Indentation depth: δ=Z–ξ; measured force: F=kξ, where ξ is cantilever deflection, Z is Piezo displacement and k is cantilever stiffness. (B) Force–depth relationships for a sample in a remote region of pollinator ovipositors (i, N=7) and those corresponding to the tip and remote regions of parasitoid ovipositors (ii, N=8). These data show higher material stiffness for parasitoid tips compared with remote regions.
Lakshminath Kundanati, and Namrata Gundiah J Exp Biol 2014;217:
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