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Fig. 2 Characterization of metal-chalcogenide thin films.

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Presentation on theme: "Fig. 2 Characterization of metal-chalcogenide thin films."— Presentation transcript:

1 Fig. 2 Characterization of metal-chalcogenide thin films.
Characterization of metal-chalcogenide thin films. (A) TEM cross-sectional image of a CdSe thin film on an Al2O3 gate dielectric (inset: the electron diffraction pattern obtained by FFT). (B) Measured (black line) and reference (red line) XRD peaks of metal-chalcogenide thin films: CdS, CdSe, CdTe, Sb2S3, Sb2Se3, PbS, PbSe, In2S3, In2Se3, ZnS, and ZnSe. (C) Secondary ion mass spectroscopy (SIMS) of a CdSe thin film on Si wafer. (D) Tauc plots for CdSemTe1−m, CdSmSe1−m, and CdmZn1−mS (m = 0, 0.5, and 1, respectively) alloy films fabricated on glass substrates. (E) Optical absorbance spectra of CdZnSeS alloy thin films on glass substrates. Indicated R, G, and B color bars show laser source wavelengths of 406 nm (blue), 520 nm (green), and 638 nm (red), respectively. Sung Min Kwon et al. Sci Adv 2018;4:eaap9104 Copyright © 2018 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).

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