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Published byMireya Limb Modified over 10 years ago
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Ruolo delle correlazioni superconduttive in conduttori mesoscopici: utilizzo per l’implementazione di rilevatori quantistici Francesco Giazotto NEST Istituto Nanoscienze-CNR & Scuola Normale Superiore Pisa, Italia Universita’ di Perugia 15 Aprile 2010
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Collaboration J. T. Peltonen M. Meschke J. P. Pekola
Low Temperature Laboratory, Helsinki University of Technology, 02015TKK, Finland
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Outline Part I: Andreev reflection and proximity effect in superconducting hybrid systems – impact on the density of states Basic concepts of electron transport in hybrid systems: AR and PE Proximity-induced modification of the DOS Probing the proximized DOS: experiments with tunnel junctions and STM spectroscopy Consequences Part II: Superconducting quantum interference proximity transistor (SQUIPT) Theoretical behavior of the SQUIPT Structure fabrication details Experimental results and comparison with theory Advantages Future perspectives
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Andreev reflection in SN contacts
BdG equations BTK, PRB 25, 4515 (1982)
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Normal metal (Semiconductor)
Proximity effect and supercurrent S N Metallic contact between a normal metal and a superconductor Reflected hole Incident electron Superconductor Normal metal (Semiconductor) Cooper pair Andreev reflection S N Electron-hole correlations: proximity effect Supercurrent Andreev bound states (ABS)
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Proximity effect in SNS systems: basic formalism
Diffusive mesoscopic N wire: quasi-1D geometry L >L >> le D = diffusion coefficient = superconducting order parameter = macroscopic phase of the order parameter ETh = D/L2 Thouless energy Usadel equations LDOS LDOS properties: N(-E) = N(E) Eg for |E| Eg Eg( = 0) 3.2ETh for >>ETh Eg( = ) = 0
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Modification of the LDOS in SNS systems due to proximity effect
J. C. Cuevas et al., PRB 73, (2006) Length and position dependence J. C. Hammer et al., PRB 76, (2007) Phase dependence
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Spatial spectroscopy of PE probed with tunnel junctions
Al/Cu SN structure with tunnel probes
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Phase-dependence of PE probed with STM spectroscopy
Al/Ag SNS proximity SQUIDs
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Phase-dependence of PE probed with STM spectroscopy
Experiment to theory comparison H. le Sueur et al., PRL 100, (2008) Phase-evolution of PE Full phase-control of the minigap amplitude
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I) -tuning of specific heat: quantum control of a thermodynamic variable
H. Rabani, F. Taddei, F. G. and R. Fazio, JAP 105, (2009); H. Rabani, F. Taddei, R. Fazio, and F. G., PRB 78, (2008) Electron entropy Electron specific heat
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II) -tuning of e-ph interaction: quantum control of relaxation
T. T. Heikkila and F. G., PRB 79, (2009)
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Sensitivity through proximity
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SQUIPT: a novel quantum interferometer
Active manipulation of the DOS of a proximity N metal Phase control (through magnetic flux) Detection (through tunnel junctions) High sensitivity for flux detection
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SQUIPT: fabrication details and configurations
Shadow-mask evaporation 27 nm 25 Oxidation 4.4 mbar 5’ (tunnel junctions) 27 nm -25 60 nm 60 (clean SN interfaces) Fabrication details Geometry and materials details L 1.5 m Probe width 200 nm N wire width 240 nm SN overlapping 250 nm Rt k LG 40 pH IJ 3 A = 200 eV
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SQUIPT (theo): prediction of its behavior in the current-bias mode
A-type configuration quasiparticle current Usadel equations
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SQUIPT (theo): current-voltage characteristic vs
N-region DOS Calculation parameters from the samples: T = 0.1 Tc Tc = 1.3 K ETh = 4 eV D = 110 cm2/s (Cu) = 200 eV Rt = 50 k Low-temperature I-V characteristic modulation amplitude to V transformer
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SQUIPT (theo): voltage modulation and transfer function
Voltage modulation V() Features: nonmonotonic behavior in I change of concavity Transfer function V/ Features: nonmonotonic behavior in I change of sign
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A-type SQUIPT (exp): current-voltage characteristic vs
Rt = 50 k T = 68 mK Rt = 50 k T = 53 mK Theory Coherent modulation of the N DOS
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A-type SQUIPT (exp): Josephson coupling in the proximity metal
Rt = 50 k T = 68 mK IJ 17 pA Rt = 50 k T = 53 mK 0 0.17 Oe A 120 m2
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A-type SQUIPT (exp): voltage modulation vs
Rt = 50 k T = 54 mK V 1 nA Change of concavity theory exp 50-60% theory device parameters non ideal phase-biasing
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A-type SQUIPT (exp): transfer function
Rt = 50 k T = 54 mK V/ 30 V/0 @ 1 nA theory
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B-type SQUIPT (exp): voltage modulation vs and transfer function
Rt = 70 k T = 53 mK V 1 nA V/ 60 V/0 @ 0.6 nA Rt = 70 k T = 53 mK doubled response in B-type SQUIPT
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A-type SQUIPT (exp): temperature dependence
Rt = 50 k I = 1 nA change of concavity between 376 mK and 411 mK Rt = 50 k I = 1 nA
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SQUIPT: dissipation and flux sensitivity
Power dissipation Pdiss = VI 100 fW increasing the probing junction resistance lowered DC SQUIDS 4-5 orders of magnitude smaller in the SQUIPT Ultralow dissipation cryogenic applications Flux sensitivity NEF = <V2N>1/2/|V/|1/2 NPre 1.2 nV/Hz1/2 NEF 2 10-5 0/Hz1/2 NEF 4 10-7 0/Hz1/2 with Nb (1.5 meV) and L = 150 nm
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SQUIPT: advantages simple DC readout scheme, similar to DC SQUID
current- or voltage-biased measurements flexibility in farication parameters and materials (semiconductors NWs, carbon nanotubes, graphene) Nb or V to enhance response and operating temperature ultralow dissipation (1-100 fW) implementation in series or parallel array for enhanced output implementation with S coolers to “actively” tune the working temperature
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SQUIPT: future perspectives
Short junction limit (<<ETh) Al and L = 150 nm (i) (ii) V SNS junction SQUIPT C. Pascual Garcia and F. G., APL 94, (2009) (iii) Noise? Both theory and experiment
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