1. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 20091 Julien Palluel BE/CO/FE

2. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 20092  WorldFIP Description and principle LHC problematic  RadHard Solutions Protection systems Re-initialisation systems Choice of components  Radiation tests : repeater Co/Co example Gammas radiations Protons tests

3. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 20093  Description Maximum length of wiring ○ 8000m with a speed of 31.25Kb/s ○ 1000m with a speed of 1Mb/s ○ 500m with a speed of 2.5Mb/s 300 km of WorldFIP fieldbus  Consequences Repeaters RadHard Diagnostic Agent Rad-Hard (FIPDiag)

4. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 20094  LHC problematic All elements must be RadHard ○ Protection against latch-up ○ Protection against single event ○ Lifetime under radiation : >200 Gy Components high life ○ Durability of the radiation tested cards

5. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 20095  Protection against latch-up  Powercycle System Example : Repeater RadHard Protection system : cut the power line with a MOS power for 1 second after the detection of an overcurrent (ex threshold 4xInom)

6. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 20096 Principle of protection against latch-up: Schema of protection against latch-up:

7. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 20097  Protection against latch-up Component reference ○ Cut-off element : MOS-FET OD 22-16V ○ Current measure : LMV 393 ○ Cut-off timer : CMOS 74HC4538

8. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 20098  Protection against Single Event  module Re-initialisation Example : Repeater RadHard Protection system : inactivity of one of the two mediums, detected by the component FIELDRIVE generates a reset signal which is processed by an integrated function in the FPGA.

9. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 20099  Protection against Single Event Up-set: Corruption of memory (address, configuration…) Example : FIPDiag module  re-initialisation of the software by a remote reset triggered by a specific message (255 characters)

10. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200910  Lifetime under radiation  selection of components not sensitive to radiation …) Example : Galvanic isolation provided by the transformer in place of optocoupler Repeater RadHard  A 5V supply is obtained from 230V sector. The regulation is linear (type regulator Balasta) with transformer and diode bridge.

11. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200911 Principle of power supply: Schema of power supply :

12. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200912  Lifetime under radiation  selection of components not sensitive to radiation Example : Repeater RadHard  Repetition process embedded in a type ACTEL FPGA anti-Fuse resistant to radiation (Ref : Actel eX128 TQ100)  CMOS components  WorldFIP technology tested in 1998 (FIELDRIVE)

13. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200913  Lifetime under radiation Repeater RadHard  WorldFIP technology tested in 1998 (TCC2, mixed fields) Référence composant : ○ SSSB222 FIELDRIVE 0421A ○ FIELDTRx.S JMF 9539 04/47 Currently these two components have evolved to a new technology that seems to be more sensitive to radiation. Tests are planned at CNGS !

14. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200914  Components turnover Period of production too short Solution  Use virtual device defined in VHDL and integrated in FPGA already tested Example : In-sourcing WorldFIP technology ○ Purchase technology WorldFIP VHDL ○ Adaptation to CERN needs ○ Realisation Project under the responsibility of Javier Serrano’s team

15. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200915

16. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200916 General architecture of the card :

17. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200917  Gammas radiations tests at Pagure’s CEA, Saclay Conditions of irradiation ○ Cobalt-60 source ○ Total Irradiation of the card (active part) ○ Dose and period: 1h30 at 20Gy/h (2.60m from the source) 5h at 60Gy/h (1.51m from the source) ○ FIP Speed : 1MB/s. ○ MacroCycle period : 100ms ○ Variables : 2 (1xRead + 1xWrite on FIPDIAG)

18. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200918  Gammas radiations tests at Pagure’s CEA, Saclay Results : ○ 1) 20Gy/h irradiation No functionnal fault (Up-set, Latch-up and Reset) The overall current of the module remained constant at 147mA Test of the anti-latch-up was working well ○ 2) 60Gy/h irradiation No functionnal fault (Up-set, Latch-up and Reset) until 310Gy up where the module has stopped working. Remarks : ○ The overall current of the module has increased from 147mA to 152mA, then 147mA just before stop working. ○ We have made some power reset until the end of this test. The repeater stayed silent ○ Once testing is completed, after 5 minutes of rest, the module was working normally. Possible reason : the supply current has drained the trapped charges in MOS thresholds and allowed them to re-operate properly. In the LHC where the modules will experience a much lower fluence, it should therefore not have any operational defect related to gamma radiation.

19. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200919  Protons tests at Louvain,Belgium Conditions of irradiation ○ Proton beam 62 Mev ○ Flux between 5x10exp7 and 5x10exp8 P/cm2/s ○ Total Irradiation of the card (active part) ○ Speed : 2.5MB/s ○ MacroCycle period : 20ms ○ Variables : 2 (1xRead + 1xWrite on FIPDIAG)

20. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200920

21. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200921  Protons tests at Louvain,Belgium Results ○ 235gy (1 Up-Set seen) on first repeater ○ 512gy (2 Up-Sets seen) on second repeater before first faults ○ Overall current mainly constant ○ Test of the anti-latch-up was working well

22. Julien PALLUEL BE/CO/FERadiation To Electronics ‘1st Combined Workshop & School-Days’ June 2nd/ 3rd 200922  Main repository www.cern.ch/cern-worldfip  Repeater Rad Hard www.cern.ch/cern-worldfip/Docs/CERN Presentations/Radiation Hard Repeater-ENG.pdf www.cern.ch/cern-worldfip/Docs/CERN Presentations/Radiation Hard Repeater-ENG.pdf http://documents.cern.ch//archive/electronic/cern/others/ab/ab- note-2005-039.pdf http://documents.cern.ch//archive/electronic/cern/others/ab/ab- note-2005-039.pdf www.cern.ch/cern-worldfip/Docs/Hardware Modules/Repeater CU-CU Radiation Hard/Manuel Repeteur Cu_Cu-FR.pdf www.cern.ch/cern-worldfip/Docs/Hardware Modules/Repeater CU-CU Radiation Hard/Manuel Repeteur Cu_Cu-FR.pdf  FIPDiag www.cern.ch/cern-worldfip/Docs/CERN Presentations/Fipdiag and FipADUC Modules-ENG.pdf www.cern.ch/cern-worldfip/Docs/CERN Presentations/Fipdiag and FipADUC Modules-ENG.pdf

23.  Radiation  Répéteur  FPGA  Proton  Gamma  WorldFIP  Latch-up  Upset  Dose