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Published byAlicia Neblett Modified over 9 years ago
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MonolithIC 3D Inc., Patents Pending MonolithIC 3D ICs RCAT Flow 1 MonolithIC 3D Inc., Patents Pending
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Monolithic 3D ICs Using SmartCut technology - the ion cutting process that Soitec uses to make SOI wafers for AMD and IBM (million of wafers had utilized the process over the last 20 years) - to stack up consecutive layers of active silicon (bond first and then cut). Soitec’s Smart Cut Patented* Flow (access the link for video).SmartCut Soitec’s Smart Cut Patented* Flow MonolithIC 3D Inc., Patents Pending 2 *Soitec’s fundamental patent US 5,374,564 expired Sep. 15, 2012
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Monolithic 3D ICs Ion cuttingIon cutting: the key idea is that if you implant a thin layer of H+ ions into a single crystal of silicon, the ions will weaken the bonds between the neighboring silicon atoms, creating a fracture plane (Figure 3). Judicious force will then precisely break the wafer at the plane of the H+ implant, allowing you to in effect peel off very thin layer. This technique is currently being used to produce the most advanced transistors (Fully Depleted SOI, UTBB transistors – Ultra Thin Body and BOX), forming monocrystalline silicon layers that are less than 10nm thick. MonolithIC 3D Inc., Patents Pending 3
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Figure 3 Using ion-cutting to place a thin layer of monocrystalline silicon above a processed (transistors and metallization) base wafer MonolithIC 3D Inc., Patents Pending 4 p- Si Oxide p- Si Oxide H Top layer Bottom layer Oxide Hydrogen implant of top layer Flip top layer and bond to bottom layer Oxide p- Si Oxide H Cleave using <400 o C anneal or sideways mechanical force. CMP. Oxide Similar process (bulk-to-bulk) used for manufacturing all SOI wafers today p- Si
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MonolithIC 3D – The RCAT path The Recessed Channel Array Transistor (RCAT) fits very nicely into the hot-cold process flow partition RCAT is the transistor used in commercial DRAM as its 3D channel overcomes the short channel effect Used in DRAM production @ 90nm, 60nm, 50nm nodes Higher capacitance, but less leakage, same drive current The following slides present the flow to process an RCAT without exceeding the 400ºC temperature limit MonolithIC 3D Inc., Patents Pending 5
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RCAT – a monolithic process flow MonolithIC 3D Inc., Patents Pending 6 Wafer, ~700µm ~100nm P- N+ P- Using a new wafer, construct dopant regions in top ~100nm and activate at ~1000º C Oxide
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MonolithIC 3D Inc. Patents Pending 7 ~100nm P- N+ P- Oxide Implant Hydrogen for Ion-Cut H+ Wafer, ~700µm
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MonolithIC 3D Inc. Patents Pending 8 ~100nm P- N+ P- ~10nm H+ Oxide Hydrogen cleave plane for Ion-Cut formed in donor wafer Wafer, ~700µm
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MonolithIC 3D Inc. Patents Pending 9 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer H+ Flip over and bond the donor wafer to the base (acceptor) wafer Base Wafer, ~700µm Donor Wafer, ~700µm
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MonolithIC 3D Inc. Patents Pending 10 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer Perform Ion-Cut Cleave Base Wafer ~700µm
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11 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Complete Ion-Cut Base Wafer ~700µm
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12 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Etch Isolation regions as the first step to define RCAT transistors Base Wafer ~700µm
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13 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Fill isolation regions (STI-Shallow Trench Isolation) with Oxide, and CMP Base Wafer ~700µm
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14 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Etch RCAT Gate Regions Base Wafer ~700µm Gate region
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15 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Form Gate Oxide Base Wafer ~700µm
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16 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Form Gate Electrode Base Wafer ~700µm
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17 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Add Dielectric and CMP Base Wafer ~700µm
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18 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Etch Thru-Layer-Via and RCAT Transistor Contacts Base Wafer ~700µm
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19 ~100nm N+ P- Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Fill in Copper Base Wafer ~700µm
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20 ~100nm N+ P- Oxide 1µ Top Portion of Base (acceptor) Wafer MonolithIC 3D Inc. Patents Pending Add more layers monolithically Base Wafer ~700µm Oxide ~100nm N+ P-
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