Download presentation
Presentation is loading. Please wait.
Published byLilian Munday Modified over 9 years ago
1
Electron Microscopy for Catalyst Characterization Dr. King Lun Yeung Department of Chemical Engineering Hong Kong University of Science and Technology CENG 511 Lecture 3
2
Electron-Specimen Interaction e-e- e-e- e-e- backscattered e - elemental contrast secondary e - surface topography Primary or unscattered e - projected sample image transmission electron microscopy http://www.jeol.com/sem_gde/imgchng.html http://www.unl.edu/CMRAcfem/ http://www.ou.edu/research/electron/www-vl/ http://www.mwrn.com/guide/electron_microscopy/microscope.htm
3
Specimen Interaction Volume (V i ) Auger secondary e- backscattered e- K X-ray L X-ray increasing depth surface information bulk information V i when accelerating V i when incident angle V i when atomic number
4
Electron-Specimen Interaction Backscattered electrons Topography (A-B) Composition (A+B)
5
Electron-Specimen Interaction Secondary electrons
6
Electron-Specimen Interaction Ugly BUGS
7
Electron-Specimen Interaction Surface Topography of Catalyst-related Materials
8
Electron-Specimen Interaction Primary or unscattered electrons diamond gold TEM
9
Electron-Specimen Interaction e-e- e-e- e-e- X-rays bulk elemental composition Auger electrons surface elemental composition Cathodaluminescence band-gap energy, electronic property http://jan.ucc.nau.edu/~wittke/Microprobe/ProbeNotes.html
10
Electron-Specimen Interaction Cathodaluminescence
11
Electron-Specimen Interaction Cathodaluminescence Ion implanted silicon patterns
12
Electron-Specimen Interaction X-rays Sampling volume for X-ray X-rays Si(Li) detector
13
Electron-Specimen Interaction Si(Li) Detector E Ne - PULSE 1 PULSE 2
14
Electron-Specimen Interaction Si(Li) Detector Window
15
Electron-Specimen Interaction Energy Dispersive X-ray Spectroscopy Si (bright)Al (bright)
16
Electron-Specimen Interaction http://jan.ucc.nau.edu/~wittke/Microprobe/Interact.html#Aug Auger Electron WKWK WLWL WMWM WNWN WGWG KK KK LL Auger e - or Auger e - Z
17
Scanning Electron Microscopy specimen Electron gun
18
SEM - Electron Gun
19
SEM - Electromagnetic Condenser Lenses
21
Figure C-8. The light optics (4) and scanning coils (1) are located inside the minicoil probe- forming lens (2) at the base of the electron column. The pole piece (7) is one solid piece of metal and protects the sample from stray magnetic fields. The x-ray beams (3) are collimated by small apertures (6), and pass through an electron trap (5) that prevents backscattered electrons from entering the x-ray pectrometers. SEM - Objective Len
22
SEM - Electron Probe
23
SEM - Image Formation-1
24
SEM - Image Formation-2
25
Scanning Electron Microscopy high voltage low voltage Effect of accelerating voltage http://www.jeol.com/sem_gde/imgchng.html
26
Scanning Electron Microscopy Effect of accelerating voltage http://www.jeol.com/sem_gde/imgchng.html
27
Scanning Electron Microscopy Effect of beam current and spot size http://www.jeol.com/sem_gde/imgchng.html
28
Scanning Electron Microscopy Effect of accelerating voltage http://www.jeol.com/sem_gde/imgchng.html
29
Scanning Electron Microscopy Effect of accelerating voltage http://www.jeol.com/sem_gde/imgchng.html
30
Scanning Electron Microscopy Incorrect alignment of objective aperture http://www.jeol.com/sem_gde/imgchng.html
31
Scanning Electron Microscopy Effect of specimen tilt http://www.jeol.com/sem_gde/imgchng.html Stereo microscopy
32
Scanning Electron Microscopy Effect of accelerating voltage http://www.jeol.com/sem_gde/imgchng.html (1) (2) (3)
33
Scanning Electron Microscopy Contrast and brightness http://www.jeol.com/sem_gde/imgchng.html
34
Scanning Electron Microscopy Astigmatism http://www.jeol.com/sem_gde/imgchng.html
35
Scanning Electron Microscopy Sample charging http://www.jeol.com/sem_gde/imgchng.html
36
Scanning Electron Microscopy Preventing charging by thin film coating http://www.jeol.com/sem_gde/imgchng.html
37
Scanning Electron Microscopy Electron beam damages and contamination http://www.jeol.com/sem_gde/imgchng.html Carbon contaminant deposited by electron beam Electron beam damage on a fly’s compound eye
38
Scanning Electron Microscopy Sources of image distortions http://www.jeol.com/sem_gde/imgchng.html
39
Scanning Electron Microscopy Influence of external disturbances http://www.jeol.com/sem_gde/imgchng.html
40
Scanning Electron Microscopy Importance of sample preparation http://www.jeol.com/sem_gde/imgchng.html
41
Electron-Specimen Interaction e-e- e-e- e-e- backscattered e - elemental contrast secondary e - surface topography Primary or unscattered e - projected sample image transmission electron microscopy http://www.jeol.com/sem_gde/imgchng.html http://www.unl.edu/CMRAcfem/ http://www.ou.edu/research/electron/www-vl/ http://www.mwrn.com/guide/electron_microscopy/microscope.htm
42
Electron-Specimen Interaction Principle of E. M. lithography Polymer resist Substrate
43
Electron Beam Lithography Micropatterning and Microfabrication PMMA resist E-beam develop resist selectively etch substrate http://www.cnf.cornell.edu/SPIEBook/spie5.htm#2.5.3.1
44
Microfabricated Catalysts deposit alternate layers of catalyst and inert micropattern and etch undercut and remove 50 nm nickel, 50 nm SiO 2
45
Supported Catalysts Metal supported on metal oxide Coarsening
46
Microfabricated Catalysts Zeolite micropatterned catalysts Zeolite Grids (200)/(020)(101) Zeolite Grids
47
Electron-Specimen Interaction Electron beam Thin sample Unscattered electrons
48
Different Types of Electron Microscopy SEM TEM Ultra-TEM HREM
49
Transmission Electron Microscopy Au/SiO 2 http://www.mwrn.com/guide.htm http://www.hei.org/research/depts/aemi/micro.htm
50
Electron-Specimen Interaction
51
Transmission Electron Microscopy Au
52
Transmission Electron Microscopy Primary or unscattered electrons diamond gold TEM http://em-outreach.sdsc.edu/web-course
53
Transmission Electron Microscopy Catalyst particle size distribution
54
Transmission Electron Microscopy Catalyst particle shape and morphology
55
Particle Morphology Selected zone dark field imaging (SZDF) ? ?
56
Particle Morphology Selected zone dark field imaging (SZDF) (100) (110)
57
Particle Morphology Weak beam dark field (WBDF)
58
Particle Morphology SZDF and WBDF techniques
59
Electron-Specimen Interaction
60
Transmission Electron Microscopy Distribution of crystallographic planes
61
Electron-Specimen Interaction
62
High Resolution Electron Microscopy http://bnlstb.bio.bnl.gov/biodocs/stem/interactive.htmlx Bismuth molybdates (Bi 2 Mo 3 O 12 - )
63
High Resolution Electron Microscopy Bismuth molybdates (Bi 2 MoO 6 - )
64
High Resolution Electron Microscopy Platinum on Alumina hydrogen Hydrogen sulfide
65
High Resolution Electron Microscopy 2 x 1 reconstruction of (110) surface of Au particle
66
High Resolution Electron Microscopy Rh/SiO 2 Reduced Oxidized
67
High Resolution Electron Microscopy Rh particles
68
High Resolution Electron Microscopy Electron-beam induced reduction of RuCl 3 on MgO
69
High Resolution Electron Microscopy Hydrogen reduced Rhodium-TiO 2
70
Electron-Specimen Interaction
Similar presentations
© 2024 SlidePlayer.com. Inc.
All rights reserved.