1. The Latchup Monitor System, ESA Meeting, December 9 th 2014 R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9 th 2014 The Latchup Monitor System Raffaello Secondo 1.The Latchup and Single Event Latchup (SEL) 2.The SEL test and Latchup Monitor system: State of the Art 3.Description of the project Contents

2. The Latchup Monitor System, ESA Meeting, December 9 th 2014 R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9 th 2014 1– The Single Event Latchup (SEL) and Latchup  A Single Event Latchup is a type of short circuit, more specifically it is the inadvertent creation of a low- impedance path between the power supply rails of a CMOS structure caused by the impact of ionized particles  A power cycle is required to correct this situation. Other Latchup reasons on CMOS chips and/or devices:  A spike of positive or negative voltage on an input or output pin of a digital chip Short circuit on the power supply Anti-latchup protection

3. The Latchup Monitor System, ESA Meeting, December 9 th 2014 R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9 th 2014 2–The SEL test and Latchup Monitor system: State of The Art Multiple devices under test usually 20-30 chips to test simultaneously 230 MeV Proton beam facility PIF at PSI used for SEL radiation tests  Multiple devices are irradiated at the same time to increase the number of occurrences  Each devices must be supplied with an efficient anti- latchup power supply  The current waveform study after the anti-latchup intervention can help to understand the phenomenon I(Load) Time L ATCHUP DETECTED D EVICE IS SHUT DOWN B EHAVIOR WITHOUT ANTI - LATCHUP Keen Anti-Latchup Protection Latchup Current fast acquisition The SEL radiation tests aim at evaluating the Latchup cross section of a component off the shelf (COTS)

4. The Latchup Monitor System, ESA Meeting, December 9 th 2014 R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9 th 2014 2–The SEL test and Latchup Monitor system: State of The Art Power Supply for the Latchup protection chassis Power Supply for the DUTs Latchup protection chassis BNC harness for current acquisition (DAQ sampling period is about 10s) PXI for driving DAQ, power supplies and temperature acquisition Temperature patch panel Data acquisition system Not compact and modular  Problems of noise, space and transportability A LatchUp Monitor based on commercial instrumentation:

5. The Latchup Monitor System, ESA Meeting, December 9 th 2014 R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9 th 2014 3. Description of the project: The LatMon PXI card Requirements:  0 to 15V & -15 to 0 – 3A Isolated power outputs  16-bit voltage and current programming  16-bit 2MS/s current reading  Temperature monitoring of the DUT  Current protection trigger based on current threshold and current profile  Output disabling upon current protection triggering  Real time current consumption recording upon current protection triggering  PXI format Hardware architecture FPGA architecture

6. The Latchup Monitor System, ESA Meeting, December 9 th 2014 R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9 th 2014 3. Description of the project The Babele`s tower Our LatMon system: Compact Modular (up to 34 output channels) The state of the art The future

7. The Latchup Monitor System, ESA Meeting, December 9 th 2014 R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9 th 2014 3. Description of the project: The LabView Software developed Management Software In LabView An example of latchup acquisition Latchup profiles programming

8. The Latchup Monitor System, ESA Meeting, December 9 th 2014 R. Secondo, A Masi, R. Losito, P. Peronnard, R. D’Aguanno, R. Ferraro The Latchup Monitor System, ESA Meeting, December 9 th 2014 4– Follow up on the LatMON Project -L ATCHUP M ONITORING : -C OMPACT AND M ODULAR -E NABLES SETTING OF A CURRENT PROFILE - R ADIATION T ESTS AT CHARM IN 2015. Schedule: - Production of a pre-series of 5 cards to test the driver on a full system - Test of a complete system based on 17 PXI cards.