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7 th International Meeting on Front-End Electronics, Montauk NY – May 18 th - 21 st, 2009 Cyclic-ADC developments for Si calorimeter of ILC Laurent ROYER, on behalf of the MicRhAu designers collaboration
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L.ROYER – FEE 09 @ Montauk – May 18-21, 20092 "Pole" MicRhAu: collaboration for µelectronics Laboratoire de Physique Corpusculaire de Clermont Ferrand Institut de Physique Nucléaire de Lyon 12 µelectronic designers analog/mixed ASIC for physic experiments and applications (medical): MICro-electronic RHone AUvergne Collaboration for µelectronic designs: Charge preamplifier Shaper, filter ADC OTA, drivers T&H Comparators http://micrhau.in2p3.fr (still under construction)
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L.ROYER – FEE 09 @ Montauk – May 18-21, 20093 Projects @ MicRhAu VFE for liquid argon TPC LHCb: preshower ALICE: dimuon trigger CMS: preshower & Ecal INNOTEP Readout chip for PET T2K ILC Readout chip for SiW Ecal Readout chip for DHcal Now TomorrowYesterday S-ATLAS S-CMS Under discussion … STAR Readout chip for ECG sensor LHC Taranis Etoile Si detector for satellite Beam Hodoscop of PM
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L.ROYER – FEE 09 @ Montauk – May 18-21, 20094 ADC developments @ MicRhAu Resolution Speed Pipeline 10 bits – 4 MS/s 35 mW Cyclic 12 bits – 0.15 MS/s 3.5 mW 0.1 MS/s 1 MS/s 10 MS/s 100 MS/s 8 bits 10 bits 12 bits 6 bits Wilkinson 12 bits – 0.0125 MS/s 2.9 mW 0.01 MS/s Flash 6 bits * – 20 MS/s 1 mW Pipeline 8 bits – 100 MS/s 240 mW Flash 8 bits – 50 MS/s 60 mW * with missing code at high dynamic range
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L.ROYER – FEE 09 @ Montauk – May 18-21, 20095 ILC: challenges for Si-W Calorimeter Sandwich structure of: thin wafers of silicon diodes (~200 µm) & tungsten layers High granularity : diode pad size of 5x5 mm 2 High segmentation : ~30 layers Large dynamic range (15 bits) 0.1 MIP -> ~3 000 MIPS Embedded Very Front End (VFE) electronics Minimal cooling available > 100.10 6 channels Ultra-low power : 25 µW per VFE channel Low POWER is the KEY issue (CdlT) « Tracker electronics with calorimetric performance »
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L.ROYER – FEE 09 @ Montauk – May 18-21, 20096 Main requirements for the ADC: –Die area: as small as possible… –Resolution: 12 bits with 2-gain shaping –Time of conversion: time budget of 500 µs to convert all data of all triggered channels –Ultra low power: 2.5 µW/ch (10% of the VFE power budget) Memory depth of 5 0.5 µW per conversion Power pulsing needed VFE electronics of Si-W Ecal Analog electronics busy 1ms (.5%) A/D conv..5ms (.25%) DAQ.5ms (.25%) IDLE MODE 198ms (99%)
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L.ROYER – FEE 09 @ Montauk – May 18-21, 20097 Single or multi-channel ADC ? Short analog sensitive wires from memory to ADC A digital Data Bus far from sensitive analog signals Only ADCs of triggered channels powered ON Conversions of channels done in parallel Integrity of analog signals saved Power saved Pedestal dispersion of ADC "added" to the dispersion of the analog part …. but calibrated With one-ADC-per-channel architecture: No "fast" ADC required Single-channel ADC scenario Multi-channel ADC scenario
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L.ROYER – FEE 09 @ Montauk – May 18-21, 20098 One cycle = two phases of amplification and sampling At each cycle (one clock period), 2 bits are delivered MSB then MSB-1, …..until LSB For an n-bit ADC, n/2 cycles are required The key block: gain-2 amplifier (switched capacitors amplifier) The precision of the gain-2 amplification gives the precision of the ADC Conventional 2-stage Cyclic architecture MSB MSB-1 A1 A2 A1 A2 one cycle
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L.ROYER – FEE 09 @ Montauk – May 18-21, 20099 + 1 redundant bit at each cycle Precision of the ADC becomes insensitive to the offset of the comparators up to ± 1/8 of the dynamic range (± 125mV for 2 V) Number of comparators is doubled 1,5 bit/stage Cyclic architecture
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200910 Enhanced architecture: "Flip-around amplifier " A single amplifier shared by the two stages As main of the power is consumed by amplifier reduction of power up to 40% MSB MSB-1 AA one cycle A A
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200911 1 MHz clock "Start conversion " signal 1 2 3 4 5 6 11 10 12 8 9 7 Output signal of the amplifier Two phases of conversion with a single amplifier Enhanced architecture: "Flip-around amplifier "
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200912 The cyclic ADC designed Clock frequency: 1MHz Supply voltage : 3.5V Technology: 0.35 µm CMOS Austriamicrosystems (reliable and cheap !!) ADC designed with the validated building blocks (Amplifier & Comparator) of a 10-bit pipeline ADC (published in IEEE NSS in June 08) but optimized for the 12-bit precision requirement Power pulsing system implemented Digital process of the bits (1.5 bit/stage algorithm) performed by an external FPGA Fully differential ADC: analog signal, reference, clock… Die area of the core = 0.175mm2 "Fully-Differential Circuits have very good PSRR and cross-talk rejection" Michael K. … and also a good rejection of common mode noise induced by digital electronics
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200913 Comparator Measured performance Sensitivity = input noise : < 280 µV (95% C.L.) Offset: 20mV ± 9 mV (68 % C.L.) far from the ± 125 mV tolerated by the 1.5bit/stage architecture Comparator Fully differential latched architecture Power consumption: 280µW
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200914 Amplifier Fully differential and rail-to-rail 2 amplification stages Resistive CMFB Power consumption: 2870 µW Capacitive load (feedback + sampling): 3 x 0.8pF Requirement @ 12 bits/1MHz Performance Open Loop DC Gain 16k 19.6k Fc à -3dB 174 Hz2,5 kHz
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200915 Charge injection: Bottom plate sampling S1 remains ON, S2 turns OFF Ground impedance smaller than1/j (C F +C S ) charges mainly injected to the ground Residual charge is constant and cancelled by differential structure of the gain-2 amplifier S1 turn OFF, S2 remains OFF Input (Vin) impedance smaller than 1/j (C P +C J ) charges mainly injected back to the input Vin CFCF CsCs S1 S2 CFCF CsCs S1 CPCP CJCJ CJCJ Vin Hardware delay introduced between control signals of S1 & S2 gates
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200916 Measurement setup for ADC Test Bench: Generic board for ADC tests Analogue signal generator: DAC 16 bits (DAC8830) PC/LabView Slow Control through USB interface Data processing with Scilab package Chip under test USB link Static measurements : Input ADC signal: ramp from 0 to 2V > 4096 steps -- 50 measurements / step
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200917 Power pulsing measurement Master current sources switched OFF 1 µs for recovery time included after power ON Measurement of consumption with duty cycle power ON/OFF Integrated consumption with ILC timing : 0.12 µW per conversion
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200918 Measurements of the performance But Yield ≈ 60% designed of a new "process-hard" gain-2 amplifier Differential Non-Linearity Noise Integral Non-Linearity DNL<+/-1 LSB No missing code Standard deviation = 0.84 LSB (420µV) INL<+/-1 LSB
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200919 New designs 4 new ADC with 4 new amplifiers designed and submitted to foundry in March Reduction of power supply voltage: 3.5V to 3.0V and optimization (reduction) of BW performance of the amplifier Improvement of the yield: reduction of biasing variation versus process fluctuation single stage amplifier Layout of the chip submitted in March 09
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200920 New Amplifiers Folded cascode structure Current CMFB (reduced consumption) Folded cascode structure Voltage CMFB
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200921 New Amplifiers Folded cascode structure (different sizing of transistors) Voltage CMFB Boosted folded cascode structure Voltage CMFB
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200922 ArchitectureCMFBDC GainConsum.BW Folded cascodeVoltage23 k570 µW436 Hz Folded cascodeCurrent23 k450 µW318 Hz Boosted Folded cascodeVoltage22 k1470 µW1700 Hz Folded cascodeVoltage28 k1020 µW428 Hz New Amplifiers performance Previous amplifier consumption: 2870 µW Simulated INL of the 4 new ADC > 174Hz required
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200923 Summary Measured performance in accordance with Si-W ECAL VFE requirements Time conversion = 7µs Consumption < 0.6µW per channel (analog memory depth of 5 and power pulsing included) 2.5% of the power budget of one VFE channel Linearity: DNL < +/1 LSB & INL < +/-1 LSB Standard deviation of Noise < 0.9 LSB Improvement of consumption and of the yield expected with the design of the new amplifiers chips have to be tested (received last week) The acquired experience with this cyclic ADC can be exported to other project and/or to faster pipeline architecture
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L.ROYER – FEE 09 @ Montauk – May 18-21, 200924 A cyclic "machine" ?? Thank you for your attention !!
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