1. 先进测试助力“中国芯”
上海华岭集成电路技术股份有限公司

2. Sino IC Technology Co.,Ltd.
Overview
Founded in 2001; Shanghai Zhang Jiang Hi-Tech Park;
Company area 4000M2, Clean room 2000M2;
Employee: 100+, Engineer: 40+;
Test program development; probe card / Load board design & layout;
8-12 inch wafer probing;
Final test;
2012/10/24
Sino IC Technology Co.,Ltd.

3. Sino IC Technology Co.,Ltd.
Clean room
2000m2 clean room
2012/10/24
Sino IC Technology Co.,Ltd.

4. Test engineering service
Design
VCD/WGL/STIL conversion
Test program development
Probe card/Load board design
Debugging
Remote connection
Program optimization
Test correlation
Mass production
Low yield analysis
WIP management
Data conversion & upload
2012/10/24
Sino IC Technology Co.,Ltd.

5. Sino IC Technology Co.,Ltd.
Remote connection
2012/10/24
Sino IC Technology Co.,Ltd.

6. 300mm wafer probing Test capacity 2012/10/24
Thin wafer probing (90um Min.)
Inkless wafer map
Wafer baking
-40oC to +150oC wafer probing
(SOP/DIP/QFP)
Final test
2012/10/24
Sino IC Technology Co.,Ltd.

7. Sino IC Technology Co.,Ltd.
Product type
RF ICs
(Bluetooth,Tuner,PA,RFID)
Memory ICs
(Flash,SRAM,EEPROM)
MOSFET ICs
( V,1-20A)
PM ICs
(LDO,PWM,DC-DC)
SoC ICs
(CPU,DSP,FPGA)
Mixed signal ICs
(MCU,Demodulator,ADC/DAC)
2012/10/24
Sino IC Technology Co.,Ltd.

8. Test system Vendor Type Configuration Devices Teradyne UltraFLEX
RF 12GHz,6.4GHz,1GHz, VHFAC,BBAC,TurboAC
SOC
J750Ex
200MHz,MSO,MTO,
512 pins
MCU/CPU
Advantest
T2000
125MHs, 512 pins
MCU
J750
100MHz,MSO,512 pins
Yokogawa
TS6000
60MHz,128 Pins
Credence
PK2
200MHz,192 pins
Memory
Verigy
V50
50Mhz,128 Pins
MCU,PMIC
Juno
DTS1000
1000V,10A-20A
PowerMOS
TRI
TR6800
PVC,OVC,MUX
PMIC
2012/10/24
Sino IC Technology Co.,Ltd.

9. Sino IC Technology Co.,Ltd.
Tester configuration
Ultra FLEX (High end SoC tester )
RF：Max. 12GHz
Serial high speed:
Max. 6.4GHz
Digital channel：1GHz
Power supply：
DC30、DC75、HDVS
Option:
BBAC、TurboAC、VHFAC
2012/10/24
Sino IC Technology Co.,Ltd. 9

10. Tester configuration cont.
J750EX Test channel:
Test rate: 200MHz
Option: ADC/DAC/Memory
J Test channel:
Test frequency: 100MHz
Option: ADC/DAC/RFID
V Test channel:
Test frequency: 50MHz
Option: Mixed signal
2012/10/24
Sino IC Technology Co.,Ltd. 10

11. Sino IC Technology Co.,Ltd.
Prober configuration
UF Wafer size: 300/200mm
Test temp.: -40oC oC
UF200A Wafer size: 200/150mm
UF200R Wafer size: 200/150mm
Wafer thickness: Min 90um
P8XL/P8 Wafer size: mm
2012/10/24
Sino IC Technology Co.,Ltd. 11

12. Sino IC Technology Co.,Ltd.
Partners
Foundry & Assembly
Vendor & Supplier
2012/10/24
Sino IC Technology Co.,Ltd.

13. Sino IC Technology Co.,Ltd.
Development flow
Cycle time: 2 weeks
1-2 weeks
1 week
Test Plan
Program
Coding
VCD conversion
Load board/
Probe card
Device setup
Debugging
Data correlation
Pilot run
(1-3 Lot)
validation
release
2012/10/24
Sino IC Technology Co.,Ltd.

14. Sino IC Technology Co.,Ltd.
Testing flow
Run card
Test set up
(program,
OD,temp.)
Wafer probing
(OD,yield)
Run correlation
wafer
FTP data
(wafer map, datalog)
Offline ink
OQC
IQC
Packing/
shipment
2012/10/24
Sino IC Technology Co.,Ltd.

15. Thanks!