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Radiative efficiency of light-emitting materials Tim Gfroerer Davidson College, Davidson, NC - Funded by Research Corporation and the Petroleum Research Fund A talk given at the SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging (2000)
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Outline Motivation Experimental technique Material system: InGaAs Conclusion
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Motivation laser diodes light-emitting diodes light is good! heat is bad!
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Motivation (continued) collection efficiency = ? internal reflection scattering refraction reabsorption
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Measuring the efficiency light in heat signal light out light in = heat + light out T heat efficiency = light in / light out
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Experimental set-up light in light out - heat
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Efficiency calibration increasing excitation excitation light + heat
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Calibrated efficiency defects light Auger
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Nonradiative mechanisms defects:Auger:
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GaInAs bandgap GaAs InAs InP substrate Ga 0.5 In 0.5 As
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Lattice mismatch misfit dislocations and strain
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Auger activation Conduction band Valence band energy momentum EaEa smaller E a smaller bandgap:
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Conclusions New radiative efficiency measurement technique Material system: InGaAs Recombination and Lattice mismatch
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