1. Test equipment for physical layer conformance testing of parallel buses exemplified for SFI-4/5 Interoperability Working Group OFC Atlanta, March 23-28, 2003 Michael Fleischer-Reumann Agilent Technologies

2. Agenda 1. Motivation 2. Location within the system architecture of parallel buses specified by OIF and their architectural parameters 3. General measurement setup to prove SFI-4/5 compliance 4. Focus on timing measurements on SFI-4/5 I/Os SFI-4 output timing SFI-5 output timing SFI-4/5 input timing 5. Specific SFI-5 - item: Jitter and Wander (common and relative) 6. Parallel test equipment: Agilent ParBERT 81250 Platform 7. Summary

3. Motivation  Interoperability – how to demonstrate it? Let modules of different vendors work together as demonstrated at the booth  Interoperability – how to assure it? Let modules of different vendors work together under corner cases or marginal conditions! But usually those can not be achieved with regular modules! Consequently use test equipment for input ports: to generate corner cases according to specifications (e.g. marginal input timing) for output ports: check that specified limits are met to measure the compliance with specifications published in implementation agreements

4. System architecture and location of different buses/standards TDM fabric FECFramer Serdes /PHY SPI-3, SPI-4-1/2, SPI-5,TFI-5 VSR-4-01..05 VSR-5 SFI-4-1/2, SFI-5 SFI-4-1/2, SFI-5 Focus of this presentation

5. parallel buses specified by OIF (selection) electrical SFI-4/5optical VSR-4/5 10Gb/s40Gb/s10Gb/s40Gb/s SFI-4SFI-4 phase 2SFI-5VSR-4-01VSR-5 Data channels and rate 16 x diff 622Mb/s 4 x diff 2.488...3.125 Gb/s 16 x diff 2.488...3.125 Gb/s 10 x optical 850nm MM 1.25Gb/s 12 x optical 850nm MM 3.318Gb/s Clock (311) 622MHz NA622... 781MHzNA Other channels NA + Tx/RxDSCProtection & Error Detection Channel (EDC) NA Data agnostic yesyes but: coded and scrambled Yes but: Deskew signal w/ special data content No: Sonet cells/frames required Virtual blocks of EDC shall match SONET frames A1/B1 bytes boarder used for deskewing

6. general measurement setups to prove SFI-4/5 compliance electricaloptical Parallel BERT ED Parallel BERT PG mux/ TX RX/ de-mux Serial BERT ED DCA O/E Serial BERT PG E/O DUT e.g. 300pin MSA Serial sideSFI-4/5 side ParBERT 10.8/45G generators stimulates DUT on serial side (electrical or optical) with nominal signals ParBERT 675M/ 3.35G Analyzers monitor DUT’s functionality (BER=0, RXDSC=ok) on SFI-4/5 and measure compliance for skew/jitter with timing measurement or signal quality with fast eye mask or eye diagram measurement. on serial side DUT’s functionality (BER=0) or performance (eye mask, jitter) is monitored with ParBERT 10.8G/45G analyzer or with DCA ParBERT 675M/3.35G generators stimulate DUT on SFI-4/5 bus varying parameters (e.g timing) to emulate critical corner cases Direct Input to Output: DItO Loopback or Back to Back (B2B)

7. Focus on: Output Timing Measurements (SFI-4)  Specification Data valid window: UI-400ps or ts/th=+/-200ps  Measurements and results BERT-scan: ts/th value and pass/fail, skew between channels Fast eye mask: user defined eye mask pass/fail Eye diagram

8. Focus on: Output Timing Measurements (SFI-5)  Specification Maximum skew between data and deskew channels: 2UI (at DUT output), 5(.65)UI after “channel”  Measurements and results Fast eye mask w/ user defined points => pass/fail Eye diagram BERT-scan data capture w/ automatic sample point adjust => skew between channels and Rx/TxDSC

9.  Specifications SFI-4: Ts/th +/-300ps SFI-5: skew < 5(.65)UI  Measurement set input timing to corner cases to verify conformance and check correct functionality or vary input timing until functional failure appears to characterize valid input timing range BUT: How to check correct functionality/ failure? Check waveform on serial side? Check BER=0 on serial side! Loop back and check BER=0 on parallel side! Focus on: Input Timing Measurements (SFI-4/SFI-5)

10. Functional verification by waveform check only? Only one waveform stems from a failure free serializer or mux!! failure free inverted bit delayed bit jammed bit

11. Specific item for SFI-5: HF jitter tolerance Jitter modulation inputs 1 : 2 power adder Eye opening at receiver Pulse or PRBS generator Noise Source DJ, (RJ) and TJ are user definable through variable amplitude and frequency simple adjustment to different data rates ParBERT Generators DUT two ranges: 50 & 500ps/V

12. range 1: >1.3UI, <120kHz  ParBERT in ext. clock mode  central clock modulated by external signal generator ParBERT Generators Specific item for SFI-5: Common plus relative Wander range 2: 120kHz  ParBERT running at 2.5Gb/s  modulate generators with slightly different frequencies 10MHz ref f1f1 f1+ff1+f MUX Test in two ranges with different setups at discrete frequencies 0.1 10.65 1.3 UI wander relative common f

13. 10.8 Gb/s675 Mb/s2.7/1.6 Gb/s 45 Gb/s 3.35 Gb/s E4805B/08A Standard/ High Performance Clock Module E4832A 675 Mb/s Module E4861A 2.7 Gb/s Module E4838A 675 Mb/s Generator E4835A 675 Mb/s Analyzer E4862A/64A/63A/65A 2.7/1.6 Gb/s Generator/Analyzer E4862B/63B 3.35 Gb/s Generator/Analyzer E4866A 10.8 Gb/s Generator Module E4867A 10.8 Gb/s Analyzer Module E4861B 3.35 Gb/s Module E4810A 3.35 Gb/s Electrical/Optical Generator Module E4811A 3.35 Gb/s Optical/Electrical Analyzer Module E4896A 45 Gb/s Pattern Generator Bundle E4867A 45 Gb/s Error Detector Bundle E4883A Lightwave Transmitter Module E4882A Lightwave Receiver Module E4884A High Performance Lightwave Option Modules Front Ends Software E4875A ParBERT Software Suit E4875A includes GUI, Measurement Software, SFI-5 and 10GbE Post-Processing Tools Q-factor and timing analysis incl. RJ/DJ separation 13.5 Gb/s N4872A 13.5 Gb/s Generator Module N4873A 13.5 Gb/s Analyzer Module ParBERT 81250 Platform Product offering

14. Summary  Variety of bus architectures requires versatile test equipment  Absolutely necessary to stimulate all relevant signals of the bus (data + clock + dsc +...) w/ the ability to vary signal parameters and data content to adopt to different buses and to create corner cases /stress conditions  Necessary to verify correct functionality by more than a waveform measurement either on serial side upon Direct Input to Output measurement w/ Serial BERT or single BERT ED channel on parallel side after loop-back-test (w/ parallel analysis equipment i.e. parallel BERT ED)  Ability of parallel BERT ED (ParBERT) to measure on all (data) channels simultaneously lowers test time significantly