1. Infrastructure of Thin Films Division in IMP
Hubert Głowiński and Janusz Dubowik, IFM PAN

2. Outline VNA-FMR FMR PIMM Dynamic measurements VSM PPMS MOKE
Static measurements
GIXRD
XRF
Structural characterization

3. Field sweep FMR
During field sweep FMR experiment magnetization vector changes its direction

4. FMR X-band spectrometer 9.18 GHz Field up to 11 kOe Gaussmeter Lock-in
Microwave
bridge
Field sweep
controller
X-band spectrometer 9.18 GHz
Field up to 11 kOe

5. External magnetic field
VNA-FMR
Port 1
Port 2
Próbka
External magnetic field
Microwave field
On frequency sweep FMR experiment magnetization vector does not change its direction
Impedancja 50 Ω.
Frequency up to 40 GHz
Coplanar waveguide 5

6. CPW – coplanar waveguide
External magnetic field
Magnetic field lines
Magnetic field lines
Electric field lines
Electric field lines
Simulated current
Homogenous current
I. Neudecker et al. JMMM 307 (2006) 148–156

7. Channelized Coplanar Waveguide
The vias are acting as a microwave wall
The other determining factor in the high frequency performance of the vias is the spacing between the rows of the vias. The wider the spacing, the lower the cutoff frequency and the closer the spacing the higher the cutoff frequency.

8. VNA-FMR
Gaussmeter
VNA
Helmholtz’s coils
Power supply

9. VNA-FMR Frequency sweep mode Different fields Field sweep mode
Different frequencies Si Ti Au Co

10. Pulsed inductive microwave magnetometer (PIMM)
Port
Port
Pulse generator
Trigger
Sampling oscilloscope
Pulse magnetic field
Bandwidth 20 GHz
Pulse risetime 55 ps
Pulse amplitude 10 V
Sample
External magnetic field

11. PIMM
Pulse generator
Oscilloscope
Helmholtz coils
Power supply

12. Vibrating Sample Magnetometer – VSM
Generator
Frequency: 35 Hz
Dual pickup coils
Magnetic field: up to 16 kOe
Temperature: -100oC to 250oC
Loudspeaker
Glass pipe
Gaussmeter
Hallotron PC
Power supply
Pickup coils
Lock-in
M.Matczak, Thesis, Politechnika Poznańska, Poznań, 2011

13. PHYSICAL PROPERTY MEASUREMENT SYSTEM (PPMS)
Options
VSM
Resistance
Torque magnetometer
PPMS system properties:
Temperature range: 2 K K.
Magnetic field: up to 9 tesla.
Magnetic field ramp rate: determined by magnet and power supply.
Temperature and magnetic field may be ramped during the measurement.
Pomiar w zależnosci od temperatury i pola oraz kąta (dla oporu)

14. MOKE Stepper motor Elektromagnet PC Wavelength λ=640 nm Z axis
Gaussmeter
Power supply
Detector
Lens
Mirror
Modulator
Analyzer
Lock-in
Polarizer
Laser
Z axis
Wavelength λ=640 nm
M.Matczak, Thesis, Politechnika Poznańska, Poznań, 2011

15. MOKE – device setup Laser diode Polarizer Modulator Lens Electromagnet
Sample holder and table
Mirror
Analyser
Detector (fotodiode)
Magnetic field sensor
M.Matczak, Thesis, Politechnika Poznańska, Poznań, 2011

16. MOKE Si Ti Au Co

17. XRF We can measure: Thickness of thin films (up to 200 nm)
Characteristic radiation
Multichannel analyzer 10 keV / 1024 channels
We can measure:
Thickness of thin films (up to 200 nm)
Chemical elements composition
1 – X-ray source, collimator, 3 – sample holder, 4 - detector
K. Załęski, Masters thesis, UAM Wydział Fizyki, Poznań Wikipedia

18. GIXRD 2θ varies 0o - 10o Seifert, model XRD 3003,
X-ray source
sample
detector
aperture
2θ varies 0o - 10o
Seifert, model XRD 3003,
X-ray source Cu-K (wavelength λ= nm)
Interference of the wave reflected from surface of the film and the surface of the substrate results in Kiessiga fringes.
Allows to measure thickness of thin films
P. Kuświk, PhD dissertation, IFM PAN, Poznań, 2010

19. Summary
We are able to characterize magnetically samples (effective fields, anisotropy, damping parameter)
We are able to characterize structure of the sample (film thickness, sublayer thickness, chemical composition)

20. Thank you for your attention!
From our data, both F/AF coupling effects, rotatable and
unidirectional anisotropy, can be interpreted as unstable AF
grain magnetization, just differing by deviating relaxation
times. A continuous transition from rotatable to dominating
unidirectional anisotropy is observed. 20