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1 Semiexclusive semileptonic B->charmdecays C. Gatto - INFN Napoli A. Mazzacane - Universita’ di Napoli April 10, 2003
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2 Strategy of the analysis uu, dd, ss e cc from the continuum Combinatorics (correlated + uncorrelated) Fake Lepton signal background B ± D o l ± B ± D o l ± B ± D o l ± X B ± o D * o ± l ± | D o B ± o D * o ± l ± | D o B ± o D * o ± l ± | D o B ± o D * o ± l ± X | D o B ± o D ** l ± | D * | D o B ± o D ** l ± | D o Reconstruct a D 0 and associated to a lepton from a common vertex Reconstruct the vtx of the other B Reconstruct the neutrino Apply loose kinematic cuts to reduce the background. e/ D0D0 B K B
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3 Which Physics can you do with the D o and D* channels Divide the Channels Gets insights on the Form Factors Add the Channels Measure Vcb with increased statistics and smaller systematic errors (than adding 2 separate measurements)
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4 Plain Exclusive vs Semiexclusive analysis for the D* How It Compares Semiexclusive analysis Several semileptonic decays of the B ->charm are selected No slow pion related problems B o D * l 2.47 times the B o D * ± l statistics: B o D * l D * D o B o D * ± l D * ± D o ± (67.7%) B D * o l D * o D o / o B ± D * o l D * o D o / o (100%) Needs input from MC to separate the various channels and the background Exclusive analysis Fully reconstruct one particular channel Must understand slow pion efficiency Lower statistics Use sidebands from data to reject the background
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5 Discriminating Among the Various Channels Use a Discriminant Analysis with: M 2 ( ) invariant B missing mass squared cos( B-Dlept ) cosine of the angle between the B meson and the D-lepton system cos( D-lept ) cosine of the angle between the D meson and the leptone R 2 Fisher discriminant Use MC and control samples to obtain the PDF’s Perform fits to extract the fractions
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6 Dependence of the Variables from q 2
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7 Applying The Final Cuts Cuts on the fitted variables D o K + - ) < 3 D o lepton vtx ) < 3 tag B) /N dof < 3 Cuts on the kinematical variables P CM (lepton) > 1.0 GeV P CM (D o ) > 0.4 GeV R2 < 0.5
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8 Status of the Analysis Analized MC and data (cut P lept > 1.0 GeV & ) MC: ~133x10 6 bbgeneric MC vs ~18x10 6 for the PDF determination. Data: most of 2000+2001+2002 on peak (~ 90x10 6 B pairs) and ~4 fb -1 off resonance. No B->D o control sample for fake muons. Using only electrons. All sources of systematic errors (except one) evaluated.
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9 Binned fit results for MC (e only) M 2 ( ) cos( D-lept ) cos( B-Dlept ) R2R2R2R2 All MC B ± D o l ± (+ ) MC B ± D o l ± X MC B ± D * l ± (+ ) MC B ± D * l ± X MC B ± D ** l ± Continuum Background
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10 Binned fit results for data (e only) All MC B ± D o l ± (+ ) MC B ± D o l ± X MC B ± D * l ± (+ ) MC B ± D * l ± X MC B ± D ** l ± Continuum Background cos( B-Dlept ) M 2 ( ) cos( D-lept ) R2R2R2R2
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11 Contour Plots
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12 Performance on SP4 MC (e only) MC TruthFit B D o l 10.1% 9.9 0.2% B D o l X 2.8% 2.6 0.5% B o D* o l 50.7% 50.5 0.5% B o D* o l X 1.5% 1.1 0.7% B o D** o l 9.6% 10.2 0.7% Continuum 0% 0.0 0.01% Background 25.5% 25.7 0.2%
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13 Performance on Data (e only) Fit B D o l 12.9 0.3% B D o l X 0.0 0.1% B o D* o l 42.6 0.4% B o D* o l X 0.0 0.2% B o D** o l 8.7 0.3% Continuum 11.5 0.2% Background 24.3 0.3%
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14 Efficiencies and Yields Statistical errors only Efficiency from MC B D o l 10.2 0.1% B o D* o l 10.8 0.1% Background 0.11 0.001 % Yield from data B D o l 9824 230 B o D* o l 32447 334 Background 19280 233
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15 Systematical Uncertainties Study Cuts: Varying the cuts applied at the final stage: 37 changes Histogram binnings: Varying the binning of the fitted histos: 22 changes PDF smoothing: Varying the parameter of the fitted PDF’s by 1 : 10 changes PDF binning: Varying the the binning of the fitted PDF’s: 11 changes
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16 D** Modelling Study Repeating the analysis with the PDF for D** blend replaced with a single resonance All the specific channel founds in SP4: D 1, D 2 *, D(2s), D’ 1, D*(2s) both neutral and charged, decaying into D 0 or D*decays 17 SP4 collections used
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17 Systematical Errors (e only) Error% B D o l B o D* o l Track efficiency0.87% B counting1.6% Electron ID (electrons only)2% Fake lepton rate (electrons only)0.13% D o ->K Branching Ratio 2.37% f +- /f 00 2.6%0.6% PDF estimation (smoothing/bin)0.45%0.3% Data selection (cuts/binnings)0.76%1.2% D** modeling0.9%0.7% MC Form Factorsno Total4.6%3.9% 4.4- 3.7% 1.3- 1.4% Largest contributions
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18 Results (blind) B D o e X 2.3% (stat) 4.6 %(syst) B o D* o e X 1.0% (stat) 3.9% (syst) This analysis B D o l (2.15 0.22) 10 -2 B o D* l (4.60 0.27) 10 -2 PDG
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19 Conclusions Status of the analysis Fit machinery is working in a consistent manner New smoothing for the PDF used since last SLAC meeting Systematical uncertainties study is almost complete Eventual improvements Split background channel into two ore more sub-channels Next Systematical uncertainties related to the MC modeling of the decays (semileptonic form factors)
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