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“A Configurable Radiation Tolerant Dual-Ported Static RAM macro, designed in a 0.25 μm CMOS technology for applications in the LHC environment.” 8th Workshop on Electronics for LHC Experiments 9-13 Sept. 2002, Colmar, France K. Kloukinas, G. Magazzu, A. Marchioro CERN EP division, 1211 Geneva 23, Switzerland
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS2 Overview Motive of Work Description of the macro-cell design Experimental Results Conclusions
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS3 Motive of Work Several Front-End ASICs for the LHC detectors are using the CERN DSM Design Kit in 0.25 μm commercial CMOS technology. Many ASICs require the use of rather large memories in Readout Pipelines, Readout Buffers and FIFOs. CERN DSM Design Kit lacks design automation tools for generating customized SRAM blocks.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS4 Proposed Design Built an SRAM macro-cell that can be configured in terms of word counts and bit organization by means of simple floorplanning procedures. Initially designed for the needs of the “Kchip” Front-End ASIC used in the CMS ECAL Preshower detector.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS5 CERN-SRAM specifications Scalable Design Configurable Bit organization (n x 9-bit). Configurable Memory Size (128 – 4Kwords). Synchronous Dual-Port Operation Permits Read/Write operations on the same clock cycle. Typical Operating Frequency: 40 MHz. Low Power Design Full Static Operation. Divided Wordline Decoding. Radiation Tolerant Design SRAM Data In Read Address CLK RD WR Write Address Data Out
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS6 Memory Cell To minimize the macro-cell area a Single Port memory cell is used based on a conventional cross-coupled inverter scheme. Gain in Memory Cell Layout Area = 18% RBL WBLWBL RBL W_WL R_WL Dual Port SRAM Cell BL WL Single Port SRAM Cell
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS7 Memory Cell Design BL WL BL GND VDD GND BL WL M1 M2 M3 PC 8.42 μm 5.60 μm Single Port memory cell Interconnect: 3 metal layers 1 st for local interconnects 2 nd for vertical bitlines and power lines 3 rd for horizontal wordlines Memory Cell Area: 47.152 μm 2
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS8 SRAM Block Diagram Dual-port functionality is realized with a time sharing access mechanism. Registered Inputs Latched Outputs SRAM Array Row decoder Column-decoder Write Drivers Clk R WA Din 7 n-7 Read Logic Dout W RA Addr. Reg. Data Reg. Data Latch clk m Timing Logic Word-line Buffers
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS9 SRAM Interface Timing Clk WA R Din Dout WRITEREADREAD/WRITE tStS tHtH W RA tStS tHtH t acc 12345
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS10 SRAM macro-cell Design
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS11 Address Mux Register Leaf cell is based on the D-F/F and the 2-input Mux standard cells found in the CERN DSM Design Kit. True & Complementary output with balanced timing. Easily sizeable by abutting the necessary number of leaf cells. Leaf Cell
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS12 Row Decoder A6 A0 WL precharge evaluate WL0 WL1 WL2 WL3 WL128 A0...A6 Decoder: 7 to 128 Hardwire-configured. Pre-routed layout block. Dynamic NAND-type. Speed, Area, Power advantages over the static NAND-type. Latched output.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS13 Column Decoder Static NAND-type implementation Column decoding is one of the last actions to be performed in the read sequence. It can be executed in parallel with other functions, and can be performed as soon as address is available. Its propagation delay does not add to the overall memory access time. Size Configurable Make use of Design kit standard cells. Decoding function is via-hole programmable.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS14 Divided Wordline Decoding Global Word-line Local Word-line Block Select Block Select Reduced Power Consumption. The non accessed portions of the memory remain in the precharge state. Improved Wordline Selection Time. Since the RC delay in each divided wordline is small due to its short length.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS15 Divided Wordline Decoding SRAM Array Row Decoder Column Dec. Write Drivers Read Logic SRAM Array Write Drivers Read Logic Word-line Buffers SRAM Array Read Logic SRAM Array Read Logic Word-line Buffers Write Drivers Global Word-line Local Word-line Block Select signals Address Data In Data Out Column Dec. Block Pre-Dec.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS16 SRAM macro-cell Design
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS17 Data Input Output Ports Data Input Register Leaf cell is based on the D-F/F standard cell from CERN DSM Design Kit. True & Complementary output with balanced timing. Data Output Latch Leaf cell is based on the Latch standard cell from CERN DSM Design Kit. Easily sizeable by abutting the necessary number of leaf cells.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS18 SRAM Data Path Bit Line Word Line Data in Write enable BL PC Data out Latch Clk precharge evaluate precharge evaluate Read Logic Write Drivers
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS19 Read Logic Substitution of the conventional sense amplifier with an asymmetric inverter. Reduced Power Consumption Stable operation al low power supply voltages. Acceptable performance for target applications. Easy to design.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS20 Replica Techniques Scalability Wordline select time depends on the size of the memory. Dummy Wordline with replica memory cells to track the wordline charge-discharge time. Bitline Timing Dummy Bitlines to mimic the delay of the bitline path over all conditions. SRAM Array BL0 Dummy Bit Lines WLdummy Dummy Word Line 128 rows
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS21 Replica Techniques Bit Line Local Word Line Data in WEN Data out Row Decoder BL PC LWLdummy BL0 A6 A0 WL PC Block Select WLdummy Global Word Line Dummy Bit Lines BL Dummy Word Line Latch
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS22 Timing Logic WLpc BLpc REN WEN Latch Clk R W WLdummy BL0 SRAM Interface Memory Cell Array Data Ouput Latch Data Input Register Address Mux Register Clk
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS23 Timing Logic Asynchronous internal timing of control signals. Static operation. Hand-shaking and transition detection to realize internal timing loops. Timing loops are initiated by the system clock and terminated upon completion of the operation. All control signals are forced back to their initial state to prepare for subsequent tasks. During standby periods, bitlines and wordlines precharge-evaluate cycles are not initiated, thus keeping the Power Consumption to a minimum.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS24 Operation and Timing
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS25 Cell Library Row Decoder WordLine Buffers SRAM column, 128 x 9bits Column Decoder Timing logic Output Data Latche Data Input Register Address Mux Register Block Pre-Decoder (50.4 μm x 1086.2 μm) Size Configurable Fixed Layout
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS26 Floorplanning gnd vdd Column Row Decoder (128 rows) Read logic Write drv. Read logic Write drv. Read logic Write drv. Read logic Write drv. Read logic Write drv. Read logic Write drv. Read logic Write drv. Block WA RA DIn DOut CLK W R Read logic Write drv. PreDecoder DIn Reg DOut Latch Timing Address Reg Column Decoder
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS27 CAD Tools Support Digital Simulation Digital Simulator VERILOG SRAM verilog module (parameterized)
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS28 CAD Tools Support Logic Synthesis Logic Synthesis Tool SYNOPSYS SRAM timing Design Kit.lib file Combined.lib file Combined.db file compilation Template
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS29 CAD Tools Support Place & Route SRAM timing Place & Route Tool Silicon Ensemble Design Kit TLF file Combined TLF file Layout view Abstract view Combined CTLF file compilation LEF file Template
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS30 Experimental Results To prove the concept of the SRAM macro-cell scalability and to evaluate the performance of the proposed design we have fabricated two test chips: a 1Kwords X 9bits and a 4Kwords X 9bits. Both chips were tested and found functional.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS31 Submitted SRAM Chips 1 st Prototype Design: CERN_SRAM_1K Configuration: 1K x 9 bit Size: ~560μm x 1,300μm Area: ~0.73mm2 Density: ~12.6Kbit/mm 2 The Memory consists of 2 Blocks of 512 x 9bits. Each Block is composed by 4 Columns of 128 X 9bits.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS32 Submitted SRAM Chips 2 nd Prototype Design: CERN_SRAM_4K Configuration: 4K x 9 bit Size: ~1,850μm x 1,300μm Area: ~2.4mm2 Density: ~15.4Kbit/mm 2 The Memory consists of 8 Blocks of 512 x 9bits. Each Block is composed by 4 Columns of 128 X 9bits.
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS33 CERN SRAM test results Functional tests Max operating frequency: Simultaneous Read/Write operations: 70MHz @ 2.5V Read access time: 7.5ns @ 2.5V Power dissipation: 15μW / MHz @ 2.5V for simultaneous Read/Write operations on the same clock cycle (0.60mW @ 40MHz). Tests for process variations: Differences in the access time < 1ns for: -3 σ, – 1.5 σ, typ, +1.5 σ, +3 σ Test chip: 4Kx9bit
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS34 Performance Tests Test Chip: 4Kword X 9bits Operation Frequency: 50MHz Power Supply: 2.5Volts Read Access Time: 7.5nsec
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS35 Performance Tests Test Chip: 4Kword X 9bits Power Supply: 2.0 - 2.7Volts Operation Frequency: 50MHz Test Patterns: All 1’s and all 0’s Checkerboard Marching 1’s Marching 0’s Pass
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS36 Power dissipation Power dissipation of macro-cell. Test chip: 4Kwords x 9bits
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS37 Irradiation Tests Ionizing Total Dose Conditions Source: X-rays. Step Irradiation: 1Mrad, 5Mrad, 10Mrad. Constant dose rate: 21.2 Krad/min. Annealing: 24h @ ~25 o C. Under bias, in Standby mode during irradiation & annealing. Results No increase in power dissipation. No measurable degradation in performance. Single Event Upset: Under preparation Test chip: 4Kwords x 9bit
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS38 CERN SRAM popularity ! ATLAS MCC chip Memory configuration: 128 x 27bit Detector: ATLAS PIXEL Lab: INFN Genova ALICE AMBRA chip Memory configuration: 16K X 9 bits Detector: ALICE Silicon Drift Det. Lab: INFN Torino ALICE CARLOS chip Memory configuration: 256 X 9 bits Detector: ALICE Silicon Drift Det. Lab: INFN Bologna LHCb SYNC chip Memory configuration: 256 X 9 bits Detector: LHCb muon system Lab: INFN Cagliary ATLAS SCAC chip Memory configuration: 128 x 18bit Detector: ATLAS tracker Lab: NEVIS Labs ATLAS DTMROC chip Memory configuration: 128 x 153 bits Detector: ATLAS TRT Lab: CERN CMS Kchip Memory configuration: 2K x 18 bits 128 x 18 bits Detector: CMS Preshower Lab: CERN Chips submitted and tested
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS39 Design Support Delivery of SRAM design library Half a day “design course” @ CERN Designer configures his macrocell Review the macrocell design
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS40 Conclusions Design Status Design meets target specifications. Macrocell has been successfully used in a number of ASIC designs. Future Plans No further development is foreseen. Design Support Contact Person: Kostas.Kloukinas@CERN.ch Information on the Web http://home.cern.ch/kkloukin
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Sept 12, 2002KLOUKINAS Kostas EP/CME-PS41 Floorplanning WA DIn Reg Timing Block Column Read logic Write drv. gnd vdd RA DIn DOut CLK W R Row Decoder (128 rows) Address Reg DOut Latch WorldLine Buffers & Block Decoders Column Decoder. WA DIn Reg Timing Address Reg Read logic Write drv. Block Column Read logic Write drv. PreDecoder gnd vdd RA DIn DOut CLK W R Row Decoder (128 rows) DOut Latch
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