1. High Speed Stepped Electronic Load for Dynamic Testing of DC/DC Converters TEAM MEMBERS: Sean Kenney Brian Sicard Mark Thomas ECE ADVISOR: Kuan Zhou INDUSTRY ADVISOR: John Canfield

2. Sean Kenney PROBLEM DEFINITION

3. Dynamic testing of DC/DC converters Available solutions on the market

4. Sean Kenney DESIGN GOALS

5. To design/build an active load with the following qualities: – Wide voltage compliance range – Very fast stepping rate – Wide range of settable currents – Unconditionally stable

6. HARDWARE IMPLEMENTATION Mark Thomas

7. Implementation Phases for Each Sub-Circuit

8. Implementation Process Research Solutions Choose Solution Design Solution Test Components Design Review Prototype Construction Prototype Testing Final Design Review PCB Implementation

9. Sub-Circuits and Components Power DAC – Power DAC Current Sinking FET Network – Current Sense – Voltage Sense Power Management – Voltage Regulators Thermal Measurement – Current Source – High Accuracy Differential Amplifier Miscellaneous – Op Amp Buffers to Provide Circuit Isolation – MOSFET Switches – Pull-up/down Resistors

10. Brian Sicard

11. DEVELOPMENT PHASES

12. FAMILIARIZATION Purpose of Familiarization Phase MSP430 Development Tools Development Software

13. ALGORITHMS Familiarization++

14. Brian Sicard

15. TEST PHASES

16. TEST MOTIVATION Component/Device Behavior Sub-Circuit Functionality Algorithm Functionality Sub-Circuit Functionality W/Algorithms Total Design Functionality Prototype Functionality

17. Sean Kenney ESTIMATED TIMELINE

19. Sean Kenney BUDGET ESTIMATE

20. Total Budget Estimate: $596.14 Budget covered by Linear Technology