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Copyright 2006 John Wiley & Sons, Inc. Beni Asllani University of Tennessee at Chattanooga Statistical Process Control Operations Management - 5 th Edition Chapter 4 Roberta Russell & Bernard W. Taylor, III
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Copyright 2006 John Wiley & Sons, Inc.4-2 Lecture Outline Introduction Sources of process variation The inspection process Control Charts Control Charts for Attributes Control Charts for Variables Control Chart Patterns Process Capability
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Copyright 2006 John Wiley & Sons, Inc.4-3 Statistical Quality Control Acceptance sampling Process Control AttributesVariables Statistical Quality Control for Acceptance Sampling and for Process Control. AttributesVariables
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Copyright 2006 John Wiley & Sons, Inc.4-4 Ch 4 - 2 © 2000 by Prentice-Hall Inc Russell/Taylor Oper Mgt 3/e Quality Control Approaches Statistical process control (SPC) Monitors production process to prevent poor quality Monitors production process to prevent poor quality Acceptance sampling Inspects random sample of product to determine if a lot is acceptable Inspects random sample of product to determine if a lot is acceptable
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Copyright 2006 John Wiley & Sons, Inc.4-5 Process Variation
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Copyright 2006 John Wiley & Sons, Inc.4-6 Types of Variations Common Cause Random Chronic Small System problems Mgt controllable Process improvement Process capability Special Cause Situational Sporadic Large Local problems Locally controllable Process control Process stability
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Copyright 2006 John Wiley & Sons, Inc.4-7 Variation from Common Causes
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Copyright 2006 John Wiley & Sons, Inc.4-8 Variation from Special Causes
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Copyright 2006 John Wiley & Sons, Inc.4-9 The Inspection Process Quality measures Attribute vs. variables Attribute vs. variables Sampling vs. screening
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Copyright 2006 John Wiley & Sons, Inc.4-10 Quality Measures Attribute a product characteristic that can be evaluated with a discrete response a product characteristic that can be evaluated with a discrete response good – bad; yes - no good – bad; yes - no Variable a product characteristic that is continuous and can be measured a product characteristic that is continuous and can be measured weight - length weight - length
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Copyright 2006 John Wiley & Sons, Inc.4-11 Sampling vs. Screening Sampling When you inspect a subset of the population When you inspect a subset of the population Screening When you inspect the whole population When you inspect the whole population The costs consideration
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Copyright 2006 John Wiley & Sons, Inc.4-12 Control Charts A graph that establishes control limits of a process Control limits upper and lower bands of a control chart upper and lower bands of a control chart Theoretical foundation of control charts Types of charts Attributes Attributes p-chart p-chart c-chart c-chart Variables Variables range (R-chart) range (R-chart) mean (x bar – chart) mean (x bar – chart)
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Copyright 2006 John Wiley & Sons, Inc.4-13 Process Control Chart 12345678910 Sample number Uppercontrollimit Processaverage Lowercontrollimit Out of control
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Copyright 2006 John Wiley & Sons, Inc.4-14 Normal Distribution =0 1111 2222 3333 -1 -2 -3 95% 99.74%
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Copyright 2006 John Wiley & Sons, Inc.4-15 A Process Is in Control If … 1.… no sample points outside limits 2.… most points near process average 3.… about equal number of points above and below centerline 4.… points appear randomly distributed
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Copyright 2006 John Wiley & Sons, Inc.4-16 Control Charts for Variables Mean chart ( x -Chart ) uses average of a sample Range chart ( R-Chart ) uses amount of dispersion in a sample
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Copyright 2006 John Wiley & Sons, Inc.4-17 Using x- bar and R-Charts Together Process average and process variability must be in control. It is possible for samples to have very narrow ranges, but their averages is beyond control limits. It is possible for sample averages to be in control, but ranges might be very large.
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Copyright 2006 John Wiley & Sons, Inc.4-18 Control Charts for Attributes p-charts uses portion defective in a sample c-charts uses number of defects in an item
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Copyright 2006 John Wiley & Sons, Inc.4-19 p-Chart UCL = p + z p LCL = p - z p z=number of standard deviations from process average p=sample proportion defective; an estimate of process average p = standard deviation of sample proportion p =p =p =p = p(1 - p) n
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Copyright 2006 John Wiley & Sons, Inc.4-20 c-Chart UCL = c + z c LCL = c - z c where c = number of defects per sample c = c
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Copyright 2006 John Wiley & Sons, Inc.4-21 Control Chart Patterns UCL LCL Sample observations consistently above the center line LCL UCL Sample observations consistently below the center line
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Copyright 2006 John Wiley & Sons, Inc.4-22 Control Chart Patterns (cont.) LCL UCL Sample observations consistently increasing UCL LCL Sample observations consistently decreasing
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Copyright 2006 John Wiley & Sons, Inc.4-23 Zones for Pattern Tests UCL LCL Zone A Zone B Zone C Zone B Zone A Process average 3 sigma = x + A 2 R = 3 sigma = x - A 2 R = 2 sigma = x + (A 2 R) = 2323 2 sigma = x - (A 2 R) = 2323 1 sigma = x + (A 2 R) = 1313 1 sigma = x - (A 2 R) = 1313 x = Sample number |1|1 |2|2 |3|3 |4|4 |5|5 |6|6 |7|7 |8|8 |9|9 | 10 | 11 | 12 | 13
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Copyright 2006 John Wiley & Sons, Inc.4-24 Control Chart Patterns 8 consecutive points on one side of the center line 8 consecutive points up or down across zones 14 points alternating up or down 2 out of 3 consecutive points in zone A but still inside the control limits 4 out of 5 consecutive points in zone A or B
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Copyright 2006 John Wiley & Sons, Inc.4-25 Sample Size Attribute charts require larger sample sizes 50 to 100 parts in a sample Variable charts require smaller samples 2 to 10 parts in a sample
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Copyright 2006 John Wiley & Sons, Inc.4-26 Process Capability Tolerances design specifications reflecting product requirements design specifications reflecting product requirements Process capability range of natural variability in a process what we measure with control charts range of natural variability in a process what we measure with control charts
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Copyright 2006 John Wiley & Sons, Inc.4-27 Process Capability (b) Design specifications and natural variation the same; process is capable of meeting specifications most of the time. Design Specifications Process (a) Natural variation exceeds design specifications; process is not capable of meeting specifications all the time. Design Specifications Process
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Copyright 2006 John Wiley & Sons, Inc.4-28 Process Capability (cont.) (c) Design specifications greater than natural variation; process is capable of always conforming to specifications. Design Specifications Process (d) Specifications greater than natural variation, but process off center; capable but some output will not meet upper specification. Design Specifications Process
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Copyright 2006 John Wiley & Sons, Inc.4-29 Process Capability Measures Process Capability Ratio Cp==Cp== tolerance range process range upper specification limit - lower specification limit 6
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Copyright 2006 John Wiley & Sons, Inc.4-30 Process Capability Measures Process Capability Index C pk = minimum x - lower specification limit 3 = upper specification limit - x 3 =,
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