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Piezoelectric Materials Chris Petorak REU Dr. Bowman and J.Jones
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Piezoelectric Materials Below Curie Temp Perovskite unit cell Unit electric dipole Poling of dipoles in single direction allows for piezoelectric properties
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Piezoelectric Properties Apply an external stress = a voltage difference between top and bottom electrode Applied Voltage = a strain in the direction of the applied electric field.
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Common Applications Sensors ex. Microphones and Hydrophones Actuators Ultrasound technology
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Fatigue of Ferroelectric Properties Narrowing of Hystersis loop Decreasing switchable polarization and d33 Increasing # of cycles leads to greater reduction in ferroelectric properties Zhang,N. Li,L. Gui,Z. Degredation of piezoelectric and dielectirc relaxation properties due to electric faitgue in PLZT ferroelectric capacitors
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Domain Wall Pinning Oxygen Vacancies Results in Space Charge Space Charge accumulate to pin domain walls Reduce domain wall mobility Therefore reducing switch able polarization
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Cycling Setup Considerations Electrical Loading Hystersis loop Apply alternating field 180 domain reorientation Parallel plate capacitor Lower Cost & Easier to find Parts Compressive Loading Stress vs. Strain Apply stress to get 1% deformation 90 domain reorientation Compressive jig setup highly sensitive and expensive
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Cycling Setup Considerations High Voltage Electric field higher than Ec Closer to saturation the greater the fatigue Low Frequency More time for E to affect domains and difficult movement Domains become set = greater internal stresses to be overcome in reverse cycle
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Building the Setup 1 st Setup – DC power source 1.4kV/mm Sinusoidal oscillator 20Hz 2 nd Setup – AC power source60Hz Tube transformer1.4kV/mm Variac Parallel plate capacitor setup under constant stress
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Building the Setup
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Trouble Shooting Calibration of variable autotransformer indirectly Linear relationship is found E = V/t 0-5 5-10 10-15
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Geometry K181 Sample #71,72 Sample #33,44 Sample #3,5 K182 Sample #13,15
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Initial Run Cycled at 1.4kV/mm K181 t =.0848in d =.965in Fail mode cracking NO significant degradation of d33 Early in cycling 10^4
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Second Run Cycled 1.2kV/mm K182 Fail t =.0839in d =.843in K181 degrades t =.0848in d =.841in
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Sample Failure
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Trouble Shooting Time constraints K182 is abandoned to focus further on K181 Current is candidate for Failure Ohms law I = V/R Resistance is geometry dependent - longer length = higher R - smaller area = higher R
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Last Run Area Considerations = R*A/t E = V/t E*t = I* *t/A A increases so does I because is independent of geometry
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Area and Current Current Macrolevel – seems to support theory Current Microlevel – current/unit area leaves a hole in argument. Probability of defects in greater in larger Volume Porosity
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Recommendations Cycle further samples Large A large t at 1.2kV/mm Small A large t at 1.4kV/mm Establish relationship for sample’s R at low I and low V. Use this to predict the Current flow through at high voltage.
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